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IPT0808-BEF

更新时间: 2022-03-18 07:54:58
品牌 Logo 应用领域
IPS /
页数 文件大小 规格书
4页 218K
描述
High current density due to double mesa technology

IPT0808-BEF 数据手册

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IPT0808-xxF  
ELECTRICAL CHARACTERISTICS(Tj = 25 unless otherwise specified)  
IPT0808-xxF  
Symbol  
Test Condition  
Quadrant  
Unit  
SE  
10  
CE  
35  
BE  
50  
IGT  
I II III  
I II III  
MAX  
MAX  
mA  
V
VD = 12V RL = 33Ω  
VGT  
1.3  
VD=VDRM, RL=3.3KΩ,  
Tj = 125 ℃  
VGD  
IL  
I II III  
MIN  
0.2  
V
I III  
25  
30  
15  
40  
5.4  
2.8  
-
50  
60  
35  
500  
-
70  
80  
50  
1000  
-
IG = 1.2 IGT  
IT = 500mA  
MAX  
mA  
II  
IH  
MAX  
MIN  
mA  
dV/dt  
VD = 67% VDRM gate open Tj = 125 ℃  
(dV/dt) c=0.1V/us Tj = 125 ℃  
(dV/dt) c=10V/us Tj = 125 ℃  
Without snubber Tj = 125 ℃  
V/us  
(dI/dt)c  
MIN  
-
-
A/ms  
4.5  
7.0  
STATIC CHARACTERISTICS  
Symbol  
VTM  
Test Conditions  
Value(MAX)  
Unit  
ITM = 17A, t p = 380uS  
Tj = 125 ℃  
Tj = 125 ℃  
Tj = 125 ℃  
1.55  
5
V
IDRM  
VD = VDRM  
VR = VRRM  
uA  
mA  
IRRM  
1
THERMAL RESISTANCES  
Symbol  
Parameter  
Value  
Unit  
Rth (j c)  
Junction to case (AC)  
1.6  
/W  
4F, Cheong won B/D, 269 Hyoje-dong, Jongno-gu, Seoul, 110-480 Korea  
TEL : +82-70 - 7574 - 2839, Fax : +82-2-6280-6382, sales@ipsemiconductor.com  
2

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