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IBM0364164CT3B-68 PDF预览

IBM0364164CT3B-68

更新时间: 2024-01-29 17:16:06
品牌 Logo 应用领域
国际商业机器公司 - IBM 时钟动态存储器光电二极管内存集成电路
页数 文件大小 规格书
72页 1201K
描述
Synchronous DRAM, 4MX16, 6ns, CMOS, PDSO54, 0.400 INCH, PLASTIC, TSOP2-54

IBM0364164CT3B-68 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP2, TSOP54,.46,32
针数:54Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.02
风险等级:5.91访问模式:FOUR BANK PAGE BURST
最长访问时间:6 ns其他特性:AUTO/SELF REFRESH
最大时钟频率 (fCLK):147 MHzI/O 类型:COMMON
交错的突发长度:1,2,4,8JESD-30 代码:R-PDSO-G54
JESD-609代码:e0长度:22.22 mm
内存密度:67108864 bit内存集成电路类型:SYNCHRONOUS DRAM
内存宽度:16功能数量:1
端口数量:1端子数量:54
字数:4194304 words字数代码:4000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:4MX16
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:TSOP2封装等效代码:TSOP54,.46,32
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度):NOT SPECIFIED电源:3.3 V
认证状态:Not Qualified刷新周期:4096
座面最大高度:1.2 mm自我刷新:YES
连续突发长度:1,2,4,8,FP最大待机电流:0.001 A
子类别:DRAMs最大压摆率:0.145 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.8 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:10.16 mm
Base Number Matches:1

IBM0364164CT3B-68 数据手册

 浏览型号IBM0364164CT3B-68的Datasheet PDF文件第2页浏览型号IBM0364164CT3B-68的Datasheet PDF文件第3页浏览型号IBM0364164CT3B-68的Datasheet PDF文件第4页浏览型号IBM0364164CT3B-68的Datasheet PDF文件第5页浏览型号IBM0364164CT3B-68的Datasheet PDF文件第6页浏览型号IBM0364164CT3B-68的Datasheet PDF文件第7页 
Discontinued (8/99 - last order; 12/99 - last ship)  
IBM036440416M  
x 412/10/2, 3.3V 72. IBM03644B432M x 412/10/2, 3.3V 72. IBM03641644M x 1612/8/2, 3.3V 72. IBM03648048M x 412/9/2, 3.3V 72.  
IBM0364804 IBM0364164  
IBM0364404 IBM03644B4  
64Mb Synchronous DRAM - Die Revision B  
Features  
• Programmable Wrap: Sequential or Interleave  
• High Performance:  
• Multiple Burst Read with Single Write Option  
-68, -260, -360, -10,  
CL=3 CL=3 CL=3 CL=3  
Units  
• Automatic and Controlled Precharge Command  
fCK  
tCK  
tAC  
tAC  
Clock Frequency  
Clock Cycle  
147  
6.8  
6
135  
7.4  
135  
7.4  
100 MHz  
• Data Mask for Read/Write control (x4, x8)  
• Dual Data Mask for byte control (x16)  
• Auto Refresh (CBR) and Self Refresh  
• Suspend Mode and Power Down Mode  
• Standard or Low Power operation  
• 4096 refresh cycles/64ms  
10  
7
ns  
ns  
ns  
1
2
Clock Access Time  
Clock Access Time  
6
6
9
1. Terminated load. See AC Characteristics on page 44.  
2. Unterminated load. See AC Characteristics on page 44.  
• Single Pulsed RAS Interface  
• Fully Synchronous to Positive Clock Edge  
• Random Column Address every CLK (1-N Rule)  
• Single 3.3V ± 0.3V Power Supply  
LVTTL compatible  
• Four Banks controlled by A12/A13 (Bank  
Select)  
• Programmable CAS Latency: 2, 3  
• Package: 54-pin 400 mil TSOP-Type II  
2 High Stack TSOJ  
• Programmable Burst Length: 1, 2, 4, 8, full-page  
Description  
The IBM0364404, IBM0364804, and IBM0364164  
are four-bank Synchronous DRAMs organized as  
4Mbit x 4 I/O x 4 Bank, 2Mbit x 8 I/O x 4 Bank, and  
1Mbit x 16 I/O x 4 Bank, respectively. IBM03644B4,  
a stacked version of the x4 component, is also  
offered. These synchronous devices achieve high-  
speed data transfer rates of up to 147MHz by  
employing a pipeline chip architecture that synchro-  
nizes the output data to a system clock. The chip is  
fabricated with IBM’s advanced 64Mbit single tran-  
sistor CMOS DRAM process technology.  
and two bank select addresses (A12, A13) are  
strobed with RAS. Ten column addresses (A0-A9)  
plus bank select addresses and A10 are strobed  
with CAS. Column address A9 is dropped on the x8  
device and column addresses A8 and A9 are  
dropped on the x16 device. Access to the lower or  
upper DRAM in a stacked device is controlled by  
CS0 and CS1, respectively.  
Prior to any access operation, the CAS latency,  
burst length, and burst sequence must be pro-  
grammed into the device by address inputs A0-A13  
during a mode register set cycle. In addition, it is  
possible to program a multiple burst sequence with  
single write cycle for write through cache operation.  
The device is designed to comply with all JEDEC  
standards for synchronous DRAM products, both  
electrically and mechanically. All the control,  
address, and data input/output (I/O or DQ) circuits  
are synchronized with the positive edge of an exter-  
nally supplied clock.  
Operating the four memory banks in an interleave  
fashion allows random access operation to occur at  
a higher rate than is possible with standard DRAMs.  
A sequential and gapless data rate of up to 147MHz  
is possible depending on burst length, CAS latency,  
and speed grade of the device. Simultaneous oper-  
ation of both decks of a stacked device is allowed,  
depending on the operation being done.  
RAS, CAS, WE, and CS are pulsed signals which  
are examined at the positive edge of each externally  
applied clock (CLK). Internal chip operating modes  
are defined by combinations of these signals, and a  
command decoder initiates the necessary timings  
for each operation. A fourteen-bit address bus  
accepts address data in the conventional RAS/CAS  
multiplexing style. Twelve row addresses (A0-A11)  
Auto Refresh (CBR), Self Refresh, and Low Power  
operation are supported.  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
19L3264.E35855A  
1/28/99  
 

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