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IBM0364164CT3C-10 PDF预览

IBM0364164CT3C-10

更新时间: 2024-02-06 14:57:42
品牌 Logo 应用领域
其他 - ETC 内存集成电路光电二极管动态存储器时钟
页数 文件大小 规格书
73页 857K
描述
x16 SDRAM

IBM0364164CT3C-10 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP2, TSOP54,.46,32
针数:54Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.02
风险等级:5.91Is Samacsys:N
访问模式:FOUR BANK PAGE BURST最长访问时间:9 ns
其他特性:AUTO/SELF REFRESH最大时钟频率 (fCLK):100 MHz
I/O 类型:COMMON交错的突发长度:1,2,4,8
JESD-30 代码:R-PDSO-G54JESD-609代码:e0
长度:22.22 mm内存密度:67108864 bit
内存集成电路类型:SYNCHRONOUS DRAM内存宽度:16
功能数量:1端口数量:1
端子数量:54字数:4194304 words
字数代码:4000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:4MX16输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TSOP2
封装等效代码:TSOP54,.46,32封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE峰值回流温度(摄氏度):NOT SPECIFIED
电源:3.3 V认证状态:Not Qualified
刷新周期:4096座面最大高度:1.2 mm
自我刷新:YES连续突发长度:1,2,4,8,FP
最大待机电流:0.001 A子类别:DRAMs
最大压摆率:0.11 mA最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:0.8 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:10.16 mmBase Number Matches:1

IBM0364164CT3C-10 数据手册

 浏览型号IBM0364164CT3C-10的Datasheet PDF文件第2页浏览型号IBM0364164CT3C-10的Datasheet PDF文件第3页浏览型号IBM0364164CT3C-10的Datasheet PDF文件第4页浏览型号IBM0364164CT3C-10的Datasheet PDF文件第5页浏览型号IBM0364164CT3C-10的Datasheet PDF文件第6页浏览型号IBM0364164CT3C-10的Datasheet PDF文件第7页 
.
IBM0364804 IBM0364164  
IBM0364404 IBM03644B4  
64Mb Synchronous DRAM - Die Revision C  
Features  
• Programmable Wrap: Sequential or Interleave  
• High Performance:  
-68 -75A, -260, -360, -10,  
CL=3 CL=3 CL=2 CL=3 CL=3  
• Multiple Burst Read with Single Write Option  
Units  
• Automatic and Controlled Precharge Command  
f
t
t
t
Clock Frequency  
Clock Cycle  
150 133 100 100 100 MHz  
CK  
CK  
• Data Mask for Read/Write control (x4, x8)  
• Dual Data Mask for byte control (x16)  
• Auto Refresh (CBR) and Self Refresh  
• Suspend Mode and Power Down Mode  
• Standard or Low Power operation  
• 4096 refresh cycles/64ms  
6.67 7.5  
10  
6
10  
6
10  
7
ns  
ns  
ns  
1
2
6
AC Clock Access Time  
AC Clock Access Time  
5.4  
9
1. Terminated load. See AC Characteristics on page 41.  
2. Unterminated load. See AC Characteristics on page 41.  
• Single Pulsed RAS Interface  
• Random Column Address every CLK (1-N Rule)  
• Single 3.3V ± 0.3V Power Supply  
LVTTL compatible  
• Fully Synchronous to Positive Clock Edge  
• Four Banks controlled by A12/A13 (Bank Select)  
• Programmable CAS Latency: 2, 3  
• Package: 54-pin 400 mil TSOP-Type II  
2 High Stack TSOJ  
• Programmable Burst Length: 1, 2, 4, 8, full-page  
Description  
The IBM0364404, IBM0364804, and IBM0364164  
are four-bank Synchronous DRAMs organized as  
4Mbit x 4 I/O x 4 Bank, 2Mbit x 8 I/O x 4 Bank, and  
1Mbit x 16 I/O x 4 Bank, respectively. IBM03644B4,  
a stacked version of the x4 component, is also  
offered. These synchronous devices achieve high-  
speed data transfer rates of up to 150MHz by  
employing a pipeline chip architecture that synchro-  
nizes the output data to a system clock. The chip is  
fabricated with IBM’s advanced 64Mbit single tran-  
sistor CMOS DRAM process technology.  
and two bank select addresses (A12, A13) are  
strobed with RAS. Ten column addresses (A0-A9)  
plus bank select addresses and A10 are strobed  
with CAS. Column address A9 is dropped on the x8  
device and column addresses A8 and A9 are  
dropped on the x16 device. Access to the lower or  
upper DRAM in a stacked device is controlled by  
CS0 and CS1, respectively.  
Prior to any access operation, the CAS latency,  
burst length, and burst sequence must be pro-  
grammed into the device by address inputs A0-A9  
during a mode register set cycle. In addition, it is  
possible to program a multiple burst sequence with  
single write cycle for write through cache operation.  
The device is designed to comply with all JEDEC  
standards set for synchronous DRAM products,  
both electrically and mechanically. All of the control,  
address, and data input/output (I/O or DQ) circuits  
are synchronized with the positive edge of an exter-  
nally supplied clock.  
Operating the four memory banks in an interleave  
fashion allows random access operation to occur at  
a higher rate than is possible with standard DRAMs.  
A sequential and gapless data rate of up to 150MHz  
is possible depending on burst length, CAS latency,  
and speed grade of the device. Simultaneous opera-  
tion of both decks of a stacked device is allowed,  
depending on the operation being done. Auto  
Refresh (CBR), Self Refresh, and Low Power opera-  
tion are supported.  
RAS, CAS, WE, and CS are pulsed signals which  
are examined at the positive edge of each externally  
applied clock (CLK). Internal chip operating modes  
are defined by combinations of these signals and a  
command decoder initiates the necessary timings  
for each operation. A fourteen bit address bus  
accepts address data in the conventional RAS/CAS  
multiplexing style. Twelve row addresses (A0-A11)  
©IBM Corporation. All rights reserved.  
Use is further subject to the provisions at the end of this document.  
19L3265.E35856B  
01/00  
Page 1 of 73  

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