Datasheet > HSD32M64D8A-10

HSD32M64D8A-10

更新时间： 2024-01-06 09:52:10

品牌	Logo	应用领域
HANBIT		动态存储器
页数	文件大小	规格书
10页	80K
描述
DRAM

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技术参数
数据手册

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HSD32M64D8A-10 技术参数

生命周期：	Contact Manufacturer	包装说明：	,
Reach Compliance Code：	unknown	风险等级：	5.75
Base Number Matches：	1

HSD32M64D8A-10 数据手册

HANBit

HSD32M64D8A

PIN FUNCTION DESCRIPTION

Name

System clock

Chip enable

Input Function

CLK

/CE

Active on the positive going edge to sample all inputs.

Disables or enables device operation by masking or enabling all inputs except

CLK, CKE and DQM

CKE

Clock enable

Masks system clock to freeze operation from the next clock cycle.

CKE should be enabled at least one cycle prior to new command.

Disable input buffers for power down in standby.

CKE should be enabled 1CLK+tSS prior to valid command.

Row/column addresses are multiplexed on the same pins.

Row address : RA0 ~ RA12, Column address : CA0 ~ CA9

A0 ~ A12

BA0 ~ BA1

/RAS

Address

Bank select address Selects bank to be activated during row address latch time.

Selects bank for read/write during column address latch time.

Row address strobe Latches row addresses on the positive going edge of the CLK with RAS low.

Enables row access & precharge.

/CAS

Column

address Latches column addresses on the positive going edge of the CLK with CAS low.

Enables column access.

strobe

/WE

Write enable

Enables write operation and row precharge.

Latches data in starting from CAS, WE active.

DQM0 ~ 7

Data

input/output Makes data output Hi-Z, tSHZ after the clock and masks the output.

Blocks data input when DQM active. (Byte masking)

mask

DQ0 ~ 63

Vcc/Vss

Data input/output

Power

Data inputs/outputs are multiplexed on the same pins.

Power and ground for the input buffers and the core logic.

supply/ground

ABSOLUTE MAXIMUM RATINGS

PARAMETER

Voltage on Any Pin Relative to Vss

Voltage on Vcc Supply Relative to Vss

Power Dissipation

SYMBOL

V_{IN ,OUT}

Vcc

RATING

-1V to 4.6V

P_D

Storage Temperature

T_STG

-55 C to 150 C

Short Circuit Output Current

I_OS

400mA

Notes:

Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded. Functional operation should be

restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum

rating conditions for extended periods may affect device reliability.

URL:www.hbe.co.kr

REV.1.0 (August.2002)

- 4 -

HANBit Electronics Co.,Ltd.

1 2 345 6 7...10

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