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HCS21HMSR PDF预览

HCS21HMSR

更新时间: 2024-02-17 16:51:35
品牌 Logo 应用领域
英特矽尔 - INTERSIL
页数 文件大小 规格书
8页 187K
描述
Radiation Hardened Dual 4-Input AND Gate

HCS21HMSR 技术参数

是否Rohs认证: 不符合生命周期:Transferred
包装说明:DFP, FL14,.3Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.74
Is Samacsys:N其他特性:RADIATION HARD CMOS/SILICON ON SAPPHIRE (SOS) TECHONOLOGY
系列:HC/UHJESD-30 代码:R-CDFP-F14
JESD-609代码:e0负载电容(CL):50 pF
逻辑集成电路类型:AND GATE功能数量:2
输入次数:4端子数量:14
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:DFP
封装等效代码:FL14,.3封装形状:RECTANGULAR
封装形式:FLATPACK电源:5 V
Prop。Delay @ Nom-Sup:22 ns传播延迟(tpd):20 ns
认证状态:Not Qualified施密特触发器:NO
筛选级别:38535V;38534K;883S子类别:Gates
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:FLAT
端子节距:1.27 mm端子位置:DUAL
总剂量:200k Rad(Si) VBase Number Matches:1

HCS21HMSR 数据手册

 浏览型号HCS21HMSR的Datasheet PDF文件第1页浏览型号HCS21HMSR的Datasheet PDF文件第3页浏览型号HCS21HMSR的Datasheet PDF文件第4页浏览型号HCS21HMSR的Datasheet PDF文件第5页浏览型号HCS21HMSR的Datasheet PDF文件第6页浏览型号HCS21HMSR的Datasheet PDF文件第7页 
Specifications HCS21MS  
Absolute Maximum Ratings  
Reliability Information  
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V  
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V  
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA  
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±25mA  
(All Voltage Reference to the VSS Terminal)  
Thermal Resistance  
SBDIP Package. . . . . . . . . . . . . . . . . . . .  
Ceramic Flatpack Package . . . . . . . . . . . 116 C/W  
Maximum Package Power Dissipation at +125 C Ambient  
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.68W  
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.43W  
If device power exceeds package dissipation capability, provide heat  
sinking or derate linearly at the following rate:  
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13.5mW/ C  
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 8.6mW/ C  
θ
θ
JA  
JC  
o
o
74 C/W  
24 C/W  
o
o
30 C/W  
o
o
o
Storage Temperature Range (TSTG) . . . . . . . . . . . -65 C to +150 C  
o
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265 C  
o
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C  
o
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1  
o
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent  
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed  
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation..  
Operating Conditions  
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V  
Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . .100ns Max  
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . 0.0V to 30% of VCC  
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . 70% of VCC of VCC  
o
o
Operating Temperature Range (T ) . . . . . . . . . . . . -55 C to +125 C  
A
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS  
GROUP  
A SUB-  
LIMITS  
(NOTE 1)  
PARAMETER  
SYMBOL  
CONDITIONS  
GROUPS  
TEMPERATURE  
MIN  
MAX  
UNITS  
µA  
o
Quiescent Current  
ICC  
VCC = 5.5V,  
VIN = VCC or GND  
1
2, 3  
1
+25 C  
-
10  
o
o
+125 C, -55 C  
-
200  
µA  
o
Output Current  
(Sink)  
IOL  
IOH  
VOL  
VCC = 4.5V, VIH = 4.5V,  
VOUT = 0.4V, VIL = 0V  
+25 C  
4.8  
4.0  
-4.8  
-4.0  
-
-
mA  
mA  
mA  
mA  
V
o
o
2, 3  
1
+125 C, -55 C  
-
-
o
Output Current  
(Source)  
VCC = 4.5V, VIH = 4.5V,  
VOUT = VCC -0.4V,  
VIL = 0V  
+25 C  
o
o
2, 3  
1, 2, 3  
+125 C, -55 C  
-
o
o
o
Output Voltage Low  
VCC = 4.5V, VIH = 3.15V,  
+25 C, +125 C, -55 C  
0.1  
IOL = 50µA, VIL = 1.35V  
o
o
o
VCC = 5.5V, VIH = 3.85V,  
IOL = 50µA, VIL = 1.65V  
1, 2, 3  
1, 2, 3  
1, 2, 3  
+25 C, +125 C, -55 C  
-
0.1  
V
V
V
o
o
o
Output Voltage High  
VOH  
VCC = 4.5V, VIH = 3.15V,  
IOH = -50µA, VIL = 1.35V  
+25 C, +125 C, -55 C  
VCC  
-0.1  
-
-
o
o
o
VCC = 5.5V, VIH = 3.85V,  
IOH = -50µA, VIL = 1.65V  
+25 C, +125 C, -55 C  
VCC  
-0.1  
o
Input Leakage  
Current  
IIN  
FN  
VCC = 5.5V, VIN = VCC or  
GND  
1
+25 C  
-
-
-
±0.5  
±5.0  
-
µA  
µA  
-
o
o
2, 3  
+125 C, -55 C  
o
o
o
Noise Immunity  
Functional Test  
VCC = 4.5V,  
VIH = 0.70(VCC), (Note 2)  
VIL = 0.30(VCC)  
7, 8A, 8B  
+25 C, +125 C, -55 C  
NOTES:  
1. All voltages reference to device GND.  
2. For functional tests, VO 4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.  
Spec Number 518762  
54  

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