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GS81302T06E-500T PDF预览

GS81302T06E-500T

更新时间: 2024-01-08 17:55:19
品牌 Logo 应用领域
GSI 双倍数据速率静态存储器内存集成电路
页数 文件大小 规格书
29页 384K
描述
DDR SRAM, 16MX8, 0.37ns, CMOS, PBGA165, 15 X 17 MM, 1 MM PITCH, FPBGA-165

GS81302T06E-500T 技术参数

是否无铅:含铅是否Rohs认证:不符合
生命周期:Not Recommended零件包装代码:BGA
包装说明:LBGA,针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.B
HTS代码:8542.32.00.41风险等级:5.32
Is Samacsys:N最长访问时间:0.37 ns
其他特性:PIPELINED ARCHITECTUREJESD-30 代码:R-PBGA-B165
长度:17 mm内存密度:134217728 bit
内存集成电路类型:DDR SRAM内存宽度:8
功能数量:1端子数量:165
字数:16777216 words字数代码:16000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:16MX8
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装形状:RECTANGULAR封装形式:GRID ARRAY, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified座面最大高度:1.5 mm
最大供电电压 (Vsup):1.9 V最小供电电压 (Vsup):1.7 V
标称供电电压 (Vsup):1.8 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15 mmBase Number Matches:1

GS81302T06E-500T 数据手册

 浏览型号GS81302T06E-500T的Datasheet PDF文件第2页浏览型号GS81302T06E-500T的Datasheet PDF文件第3页浏览型号GS81302T06E-500T的Datasheet PDF文件第4页浏览型号GS81302T06E-500T的Datasheet PDF文件第5页浏览型号GS81302T06E-500T的Datasheet PDF文件第6页浏览型号GS81302T06E-500T的Datasheet PDF文件第7页 
GS81302T06/11/20/38E-500/450/400/350  
500 MHz–350 MHz  
144Mb SigmaDDRTM-II+  
Burst of 2 SRAM  
165-Bump BGA  
Commercial Temp  
Industrial Temp  
1.8 V V  
DD  
1.8 V or 1.5 V I/O  
SRAMs are just one element in a family of low power, low  
voltage HSTL I/O SRAMs designed to operate at the speeds  
needed to implement economical high performance  
networking systems.  
Features  
• 2.5 Clock Latency  
TM  
• Simultaneous Read and Write SigmaDDR Interface  
• JEDEC-standard pinout and package  
• Double Data Rate interface  
• Byte Write controls sampled at data-in time  
• Burst of 2 Read and Write  
• On-Die Termination (ODT) on Data (D), Byte Write (BW),  
and Clock (K, K) inputs  
• 1.8 V +100/–100 mV core power supply  
• 1.5 V or 1.8 V HSTL Interface  
Clocking and Addressing Schemes  
The GS81302T06/11/20/38E SigmaDDR-II+ SRAMs are  
synchronous devices. They employ two input register clock  
inputs, K and K. K and K are independent single-ended clock  
inputs, not differential inputs to a single differential clock input  
buffer.  
• Pipelined read operation  
Each internal read and write operation in a SigmaDDR-II+ B2  
RAM is two times wider than the device I/O bus. An input data  
bus de-multiplexer is used to accumulate incoming data before  
it is simultaneously written to the memory array. An output  
data multiplexer is used to capture the data produced from a  
single memory array read and then route it to the appropriate  
output drivers as needed. Therefore, the address field of a  
SigmaDDR-II+ B2 RAM is always one address pin less than  
the advertised index depth (e.g., the 16M x 8 has an 8M  
addressable index).  
• Fully coherent read and write pipelines  
• ZQ pin for programmable output drive strength  
• Data Valid Pin (QVLD) Support  
• IEEE 1149.1 JTAG-compliant Boundary Scan  
• 165-bump, 15 mm x 17 mm, 1 mm bump pitch BGA package  
• RoHS-compliant 165-bump BGA package available  
SigmaDDR-IIFamily Overview  
The GS81302T06/11/20/38E are built in compliance with the  
SigmaDDR-II+ SRAM pinout standard for Common I/O  
synchronous SRAMs. They are 150,994,944-bit (144Mb)  
SRAMs. The GS81302T06/11/20/38E SigmaDDR-II+  
Parameter Synopsis  
-500  
2.0 ns  
0.45 ns  
-450  
2.2 ns  
0.45 ns  
-400  
2.5 ns  
0.45 ns  
-350  
tKHKH  
tKHQV  
2.86 ns  
0.45 ns  
Rev: 1.03c 11/2011  
1/29  
© 2011, GSI Technology  
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.  

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