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GRT155R71H823KE01# PDF预览

GRT155R71H823KE01#

更新时间： 2023-09-03 20:39:43
品牌 Logo 应用领域
村田 - MURATA 医疗医疗器械
页数 文件大小 规格书
31页 1845K
描述
汽车[信息娱乐 / 舒适设备],工业设备,植入式以外的医疗器械设备 [GHTF A/B/C]

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GRT155R71H823KE01# 数据手册

 浏览型号GRT155R71H823KE01#的Datasheet PDF文件第1页浏览型号GRT155R71H823KE01#的Datasheet PDF文件第3页浏览型号GRT155R71H823KE01#的Datasheet PDF文件第4页浏览型号GRT155R71H823KE01#的Datasheet PDF文件第5页浏览型号GRT155R71H823KE01#的Datasheet PDF文件第6页浏览型号GRT155R71H823KE01#的Datasheet PDF文件第7页 
■ Specifications and Test Methods  
No Item  
Specification  
Test Method（Ref. Standard:AEC-Q200）  
-
-
1 Pre-and Post-Stress  
Electrical Test  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-12.5%  
DF≦0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
2 High Temperature  
Exposure (Storage)  
I.R.(Room Temp.)  
More than 25Ω・F  
Test Temperature  
Test Time  
Maximum Operating Temperature +/-3℃  
1000+/-12h  
Post-treatment  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-10%  
DF≦0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
3 Temperature Cycling  
I.R.(Room Temp.)  
More than 50Ω・F  
Temperature Cycling  
Post-treatment  
Per EIA-469  
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.  
Appearance  
No defects or abnormalities.  
4 Destructive Physical  
Analysis  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-12.5%  
DF≦0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
5 Biased Humidity  
I.R.(Room Temp.)  
More than 5Ω・F  
Test Temperature  
Test Humidity  
Test Time  
85+/-3℃  
80%RH to 85%RH  
1000+/-12h  
Test Voltage  
The rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)  
Charge/discharge current 50mA max.  
Post-treatment  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-12.5%  
DF≦0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
6 Operational Life  
I.R.(Room Temp.)  
More than 5Ω・F  
Test Temperature  
Test Time  
Maximum Operating Temperature +/-3℃  
1000+/-12h  
Test Voltage  
100% of the rated voltage  
Charge/discharge current 50mA max.  
Post-treatment  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
No defects or abnormalities.  
Shown in Dimension.  
Visual inspection  
7 Appearance  
8 Dimension  
Using Measuring instrument of dimension.  
GRT155R71H823KE01-01A  
2
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