Datasheet > GRM1555C2A102GE01

GRM1555C2A102GE01

更新时间： 2022-02-26 14:46:45

品牌	Logo	应用领域
村田 - MURATA		/
页数	文件大小	规格书
30页	778K
描述
Chip Multilayer Ceramic Capacitors for General Purpose

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Item

Specification

Test Method (Ref. Standard:JIS C 5101, IEC60384)

Solder the capacitor on the test substrate shown in Fig.3.

No.

15 High

Appearance No defects or abnormalities.

Temperature

High Humidity

(Steady)

Test Temperature :

Test Humidity :

Test Time :

40+/-2℃

Capacitance Within +/-7.5% or +/-0.75pF (Whichever is larger)

Change

90%RH to 95%RH

500+/-12h

Q or D.F.

Q≧200

Test Voltage :

Rated Voltage

Charge/Discharge Current : 50mA max.

I.R.

More than 500MΩ or 25Ω･F (Whichever is smaller)

Let sit for 24+/-2hours at room temperature, then measure.

Post-treatment :

16 Durability

Appearance No defects or abnormalities.

Solder the capacitor on the test substrate shown in Fig.3.

Test Temperature :

Test Time :

Test Voltage :

Maximum Operating Temperature+/-3℃

Capacitance Within +/-3% or +/-0.3pF (Whichever is larger)

Change

1000+/-12h

200% of the rated voltage

Q or D.F.

Q≧350

Charge/Discharge Current : 50mA max.

I.R.

More than 1000MΩ or 50Ω･F (Whichever is smaller)

Let sit for 24+/-2hours at room temperature, then measure.

Post-treatment :

Table A Capacitance Change between at Reference Temp. and at each Temp. (%)

-55℃

-30℃

-10℃

Char.

Max.

0.4

Max.

0.58

Min.

-0.24

Min.

-0.17

Max.

0.25

Min.

-0.11

GRM1555C2A102GE01-01A

1 2 345 6 7...30

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