■ Specifications and Test Methods
No
1
Item
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384)
Rated Voltage
Shown in Rated value.
The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V(peak to peak) or V(zero to peak),
whichever is larger, should be maintained within the rated voltage range.
2
3
4
Appearance
Dimension
No defects or abnormalities.
Shown in Rated value.
Visual inspection.
Using Measuring instrument of dimension.
Voltage proof
No defects or abnormalities.
Measurement Point
Test Voltage
Applied Time
Between the terminations
300% of the rated voltage
1s to 5s
Charge/discharge current 50mA max.
5
Insulation
More than 10000MΩ
Measurement Temperature Room Temperature
Resistance(I.R.)
(Room Temperature)
Measurement Point
Measurement Voltage
Charging Time
Between the terminations
Rated Voltage
1min
Charge/discharge current 50mA max.
Shown in Rated value.
Measurement Temperature Room Temperature
Measurement Frequency 1.0+/-0.1MHz
6
7
8
Capacitance
Measurement Voltage
0.5 to 5.0Vrms
Measurement Temperature Room Temperature
Measurement Frequency 1.0+/-0.1MHz
Q or Dissipation Factor Q≧400+20C C:Nominal Capacitance(pF)
(D.F.)
Measurement Voltage
0.5 to 5.0Vrms
Temperature
Characteristics of
Capacitance
No bias
Nominal values of the temperature coefficientis is
shown in Rated value. But, the Capacitance Change
under Reference Temperature is shown inTable A.
Capacitance Drift: Within +/-0.2% or +/-0.05pF
(Whichever is larger.)
The capacitance change should be measured after 5 min at each specified temp. stage.
Capacitance value as a reference is the value in "*" marked step.
Capacitance Drift
The capacitance drift is calculated by dividing the differences between the maximum and minimum
measured values in the step 1,3 and 5 by the cap. value in step 3.
Less than 1.0Vrms (Refer to the individual data sheet)
Measurement Voltage
Temperature Step
9
Adhesive Strength of
Termination
No removal of the terminations or other defect should occur.
Mounting method
Applied Force
Solder the capacitor on the test substrate
1N
Holding Time
10+/-1s
Applied Direction
In parallel with the test substrate and vertical with the capacitor side
GRM0115C1E3R8WE01-01A
2