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GM71CS17803CLT-5 PDF预览

GM71CS17803CLT-5

更新时间: 2024-02-17 18:00:42
品牌 Logo 应用领域
其他 - ETC 动态存储器
页数 文件大小 规格书
9页 105K
描述
x8 EDO Page Mode DRAM

GM71CS17803CLT-5 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
Reach Compliance Code:unknown风险等级:5.78
访问模式:FAST PAGE WITH EDO最长访问时间:50 ns
其他特性:RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH/SELF REFRESH; BATTERY BACKUP OPERATIONI/O 类型:COMMON
JESD-30 代码:R-PDSO-G28JESD-609代码:e0
内存密度:16777216 bit内存集成电路类型:EDO DRAM
内存宽度:8功能数量:1
端口数量:1端子数量:28
字数:2097152 words字数代码:2000000
工作模式:ASYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:2MX8
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:TSOP封装等效代码:TSOP28,.46
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
认证状态:Not Qualified刷新周期:2048
自我刷新:YES最大待机电流:0.00015 A
子类别:DRAMs最大压摆率:0.13 mA
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

GM71CS17803CLT-5 数据手册

 浏览型号GM71CS17803CLT-5的Datasheet PDF文件第3页浏览型号GM71CS17803CLT-5的Datasheet PDF文件第4页浏览型号GM71CS17803CLT-5的Datasheet PDF文件第5页浏览型号GM71CS17803CLT-5的Datasheet PDF文件第6页浏览型号GM71CS17803CLT-5的Datasheet PDF文件第7页浏览型号GM71CS17803CLT-5的Datasheet PDF文件第9页 
GM71C17803C  
GM71CS17803CL  
Notes:  
1. AC Measurements assume tT = 2ns.  
2.  
An initial pause of 200us is required after power up followed by a minimum of eight  
initialization cycles (any combination of cycles containing RAS only refresh or CAS-before-  
RAS refresh). If the internal refresh counter is used, a minimum of eight CAS-before-RAS  
refresh cycles are required.  
3.  
4.  
Operation with the tRCD(max) limit insures that tRAC(max) can be met, tRCD(max) is specified as a  
reference point only; if tRCD is greater than the specified tRCD(max) limit, then access time is  
controlled exclusively by tCAC.  
Operation with the tRAD(max) limit insures that tRAC(max) can be met, tRAD(max) is specified as a  
reference point only; if tRAD is greater than the specified tRAD(max) limit, then access time is  
controlled exclusively by tAA.  
5.  
6.  
Either tODD or tCDD must be satisfied.  
Either tDZO or tDZC must be satisfied.  
7. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also,  
transition times are measured between VIH (min) and VIL (max).  
8.  
Assumes that tRCD <= tRCD (max) and tRAD <= tRAD (max). If tRCD or tRAD is greater than the  
maximum recommended value shown in this table, tRAC exceeds the value shown.  
9.  
Measured with a load circuit equivalent to 1TTL loads and 100pF.  
Assumes that tRCD >= tRCD (max) and tRAD <= tRAD (max).  
Assumes that tRCD <= tRCD (max) and tRAD >= tRAD (max).  
Either tRCH or tRRH must be satisfied for a read cycles.  
10.  
11.  
12.  
tOFF (max) and tOEZ (max) define the time at which the outputs achieve the open circuit condition  
and are not referred to output voltage levels.  
13.  
tWCS, tRWD, tCWD , tAWD and tCPW are not restrictive operating parameters. They are included in the  
data sheet as electrical characteristics only; if tWCS >=tWCS(min), the cycle is an early write cycle  
and the data out pin will remain open circuit (high impedance) throughout the entire cycle; if  
tRWD>=tRWD(min), tCWD>=tCWD(min) and tAWD>=tAWD(min), or tCWD>=tCWD(min), tAWD>=tAWD(min)  
and tCPW>=tCPW(min), the cycle is a read modify write and the data output will contain data read  
from the selected cell; if neither of the above sets of conditions is satisfied, the condition of the  
data out (at access time) is indeterminate.  
14.  
These parameters are referred to CAS leading edge in early write cycle and to WE leading edge  
in a delayed write or a read modify write cycle.  
15.  
tRASP defines RAS pulse width in EDO page mode cycles.  
16.  
17.  
18.  
Access time is determined by the longest among tAA , tCAC and tACP.  
In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying  
data to the device. After RAS is reset, if tOEH>=tCWL, the I/O pin will remain open circuit (high  
impedance): if tOEH<=tCWL, invalid data will be out at each I/O.  
19.  
tHPC (min ) can be achieved during a series of EDO page mode write cycles or EDO page  
mode read cycles. If both write and read operation are mixed in a EDO page mode RAS cycle  
(EDO page mode mix cycle (1)(2) ),minimum value of CAS cycle( tCAS + tCP + 2tT) becomes  
greater than the specified tHPC (min) value. The value of CAS cycle time of mixed EDO page  
mode is shown in EDO page mode mix cycle(1) and (2).  
Rev 0.1 / Apr’01  

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