EB52F4D15BN-19.200M
EB52F4 D 15 B N -19.200M
Series
Nominal Frequency
3.3Vdc 14-Pin DIP LVCMOS TCXO
19.200MHz
Initial Tolerance
±2.5ppm Maximum
Control Voltage
None (No Connect on Pin 1)
Frequency Stability
±1.5ppm Maximum
Operating Temperature Range
0°C to +70°C
ELECTRICAL SPECIFICATIONS
Nominal Frequency
19.200MHz
Initial Tolerance
±2.5ppm Maximum (Measured at Nominal Vdd and Vc)
±1.5ppm Maximum
Frequency Stability
Frequency Stability vs. Input Voltage ±0.3ppm Maximum (Vdd ±5%)
Frequency Stability vs. Aging
Frequency Stability vs. Load
Operating Temperature Range
Supply Voltage
±1ppm/Year Maximum (at 25°C)
±0.2ppm Maximum (±10%)
0°C to +70°C
3.3Vdc ±5%
Input Current
15mA Maximum (Measured at Steady State at 25°C)
90% of Vdd Minimum
Output Voltage Logic High (Voh)
Output Voltage Logic Low (Vol)
Rise/Fall Time
10% of Vdd Maximum
6nSec Maximum (Measured at 20% to 80% of waveform)
50% ±5% (Measured at 50% of waveform)
15pF Maximum
Duty Cycle
Load Drive Capability
Output Logic Type
CMOS
Control Voltage
None (No Connect on Pin 1)
10kOhms Typical
Input Impedance
Phase Noise
-70dBc/Hz at 10Hz Offset, -100dBc/Hz at 100Hz Offset, -130dBc/Hz at 1kHz Offset, -140dBc/Hz at 10kHz
Offset, -145dBc/Hz at 100kHz Offset (Typical Values at 19.440MHz)
Storage Temperature Range
-55°C to +125°C
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
Fine Leak Test
MIL-STD-883, Method 1014 Condition A
MIL-STD-883, Method 1014 Condition C
MIL-STD-883, Method 2004
Gross Leak Test
Lead Integrity
Mechanical Shock
Resistance to Soldering Heat
Resistance to Solvents
Solderability
MIL-STD-202, Method 213 Condition C
MIL-STD-202, Method 210
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
Temperature Cycling
Vibration
MIL-STD-883, Method 1010
MIL-STD-883, Method 2007 Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Rev A 2/16/2010 | Page 1 of 4