CY62127DV30
DC Input Voltage[5] ................................ −0.3V to VCC + 0.3V
Maximum Ratings
Output Current into Outputs (LOW)............................. 20 mA
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
Storage Temperature ..................................–65°C to +150°C
Latch-up Current.....................................................> 200 mA
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Operating Range
Supply Voltage to Ground Potential
......................................................................... −0.3V to 3.9V
[6]
Range
Industrial
Automotive
Ambient Temperature (TA)
–40°C to +85°C
VCC
2.2V to 3.6V
2.2V to 3.6V
DC Voltage Applied to Outputs
in High-Z State[5] ....................................−0.3V to VCC + 0.3V
–40°C to +125°C
DC Electrical Characteristics (Over the Operating Range)
–45
–55
–70
Parameter Description
Test Conditions
Min. Typ.[4] Max. Min. Typ.[4] Max. Min Typ.[4] Max. Unit
VOH
VOL
VIH
Output HIGH 2.2 < VCC < 2.7 IOH = −0.1 mA 2.0
2.0
2.4
2.0
2.4
V
V
V
Voltage
2.7 < VCC < 3.6 IOH = −1.0 mA 2.4
Output LOW
Voltage
2.2 < VCC < 2.7 IOL = 0.1 mA
2.7 < VCC < 3.6 IOL = 2.1 mA
2.2 < VCC < 2.7
0.4
0.4
0.4
0.4
0.4
0.4
Input HIGH
Voltage
1.8
2.2
VCC 1.8
+ 0.3
VCC 1.8
+ 0.3
VCC
+ 0.3
2.7 < VCC < 3.6
VCC 2.2
+ 0.3
VCC 2.2
+ 0.3
VCC
+ 0.3
VIL
Input LOW
Voltage
2.2 < VCC < 2.7
2.7 < VCC < 3.6
−0.3
−0.3
0.6 −0.3
0.8 −0.3
0.6 −0.3
0.8 −0.3
0.6
0.8
V
IIX
Input Leakage GND < VI < VCC
Current
Ind’l −1
Auto
+1
−1
−4
−1
−4
+1
+4
+1
+4
−1
+1 µA
µA
IOZ
Output
GND < VO < VCC, Output Ind’l −1
Disabled
+1
−1
+1 µA
µA
Leakage
Current
Auto
ICC
VCC Operating f = fMAX = 1/tRC VCC = 3.6V,
6.5
13
5
10
5
10 mA
Supply Current
IOUT = 0 mA,
CMOS level
f = 1 MHz
0.85 1.5
0.85 1.5
0.85 1.5
ISB1
Automatic CE CE > VCC − 0.2V,
L
Ind’l
1.5
5
1.5
1.5
1.5
5
15
4
1.5
5
µA
µA
Power-down
Current—
VIN > VCC − 0.2V, VIN
Auto
< 0.2V,
CMOS Inputs f = fMAX (Address and LL
1.5
4
1.5
4
Data Only),
f = 0 (OE, WE, BHE
and BLE)
ISB2
Automatic CE CE > VCC − 0.2V,
L
Ind’l
1.5
1.5
5
4
1.5
1.5
1.5
5
15
4
1.5
1.5
5
4
Power-down
Current—
V
IN > VCC − 0.2V or
Auto
VIN < 0.2V,
CMOS Inputs f = 0, VCC = 3.6V
LL
Capacitance[7]
Parameter
Description
Test Conditions
Max.
Unit
pF
CIN
Input Capacitance
Output Capacitance
TA = 25°C, f = 1 MHz
VCC = VCC(typ)
8
8
COUT
pF
Notes:
5. V
= −2.0V for pulse durations less than 20 ns., V
= Vcc+0.75V for pulse durations less than 20 ns.
IH(max.)
IL(min.)
6. Full device operation requires linear ramp of V from 0V to V
7. Tested initially and after any design or proces changes that may affect these parameters.
& V must be stable at V
for 500 µs.
CC
CC(min)
CC
CC(min)
Document #: 38-05229 Rev. *H
Page 3 of 11
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