Features
■ Resistance value as low as 0.001 ohm
■ High power density
Applications
■ Power supplies
■ Stepper motor drives
■ Inductance less than 5 nH
■ RoHS compliant*
CRF Series - High Power Current Sense Chip Resistor
Electrical Characteristics
Rating
CRF0805
CRF1206
CRF2512
(0.001 to 0.010 Ω) 2 W
(0.011 to 0.050 Ω) 1 W
Power Rating @ 70 °C
0.5 W
1 W
Operating Temperature Range
Derated to Zero Load at
Maximum Working Voltage
Resistance
-55 °C to +170 °C
+170 °C
1/2
(P x R)
0.005 ~ 0.020 Ω
0.001 ~ 0.030 Ω
1 %, 5 %
0.001 ~ 0.050 Ω
275 PPM/°C
Resistance Tolerance
(0.001 Ω)
Temperature Coefficient
100 PPM/°C
(0.002 to 0.010 Ω) 100 PPM/°C
(>0.010 Ω)
75 PPM/°C
Performance Characteristics
Specification
CRF1206
Test
Conditions
CRF0805
ΔR (1 % + 0.0005 Ω)
CRF2512
ΔR (0.5 % + 0.0005 Ω)
-55 ˚C to +150 ˚C,
Thermal Shock
300 Cycles, 15 minutes
Short Time Overload
Low Temperature Storage
High Temperature Exposure
5 X Rated Power for 5 seconds ΔR (0.5 % + 0.0005 Ω)
ΔR (0.5 % + 0.0005 Ω)
ΔR (0.5 % + 0.0005 Ω)
ΔR (0.5 % + 0.0005 Ω)
-55 ˚C for 1000 hours
1000 hours @ + 170 ˚C
ΔR (0.5 % + 0.0005 Ω)
ΔR (1 % + 0.0005 Ω)
+ 85 ˚C, 85 % RH,
Bias Humidity
N/A
ΔR (1 % + 0.0005 Ω)
10 % Bias, 1000 hours
100 g for 6 milliseconds,
Mechanical Shock
N/A
ΔR (0.5 % + 0.0005 Ω)
5 pulses
Frequency varied 10-2000 KHz
in one minute, 3 directions,
12 hours
N/A
ΔR (0.5 % + 0.0005 Ω)
ΔR (1 % + 0.0005 Ω)
Vibration
1000 hours at rated power at
+70 ˚C, 1.5 hours on, 0.5 hours
off
Load Life
ΔR (1 % + 0.0005 Ω)
+260 ˚C, 10-12 second dwell,
Resistance to Solder Heat
Moisture Resistance
ΔR (0.5 % + 0.0005 Ω)
ΔR (1 % + 0.0005 Ω)
ΔR (0.5 % + 0.0005 Ω)
ΔR (0.5 % + 0.0005 Ω)
25 mm/second emergence
MIL-STD-202 Method 106, 0 %
power (7a and 7b not required)
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.