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CMZB53 PDF预览

CMZB53

更新时间: 2024-01-11 06:11:17
品牌 Logo 应用领域
东芝 - TOSHIBA 二极管齐纳二极管测试光电二极管
页数 文件大小 规格书
5页 177K
描述
TOSHIBA Zener Diode Silicon Diffused Type

CMZB53 技术参数

生命周期:End Of Life包装说明:R-PDSO-F2
针数:2Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.10.00.50
风险等级:5.63Is Samacsys:N
配置:SINGLE二极管元件材料:SILICON
二极管类型:ZENER DIODE最大动态阻抗:85 Ω
JESD-30 代码:R-PDSO-F2元件数量:1
端子数量:2最高工作温度:150 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性:UNIDIRECTIONAL最大功率耗散:1 W
认证状态:Not Qualified标称参考电压:53 V
子类别:Voltage Reference Diodes表面贴装:YES
技术:ZENER端子形式:FLAT
端子位置:DUAL最大电压容差:10%
工作测试电流:5 mABase Number Matches:1

CMZB53 数据手册

 浏览型号CMZB53的Datasheet PDF文件第2页浏览型号CMZB53的Datasheet PDF文件第3页浏览型号CMZB53的Datasheet PDF文件第4页浏览型号CMZB53的Datasheet PDF文件第5页 
CMZB12~CMZB53  
TOSHIBA Zener Diode Silicon Diffused Type  
CMZB12~CMZB53  
Communication, Control and  
Unit: mm  
Measurement Equipment  
Constant Voltage Regulation  
Transient Suppressors  
Average power dissipation: P = 1.0 W  
Zener voltage: V = 12 to 53 V  
Z
Suitable for high-density board assembly due to the use of a small  
TM  
surface-mount package, MFLAT  
0.16  
1.75 ± 0.1  
Absolute Maximum Ratings (Ta = 25°C)  
+ 0.2  
2.4 0.1  
Characteristics  
Power dissipation  
Symbol  
P
Rating  
Unit  
1.0 (Note 1)  
40 to 150  
40 to 150  
W
°C  
°C  
ANODE  
CATHODE  
Junction temperature  
T
j
Storage temperature range  
T
stg  
Note 1: Ta = 40°C  
JEDEC  
Device mounted on a glass-epoxy board  
Board size: 50 mm × 50 mm  
Soldering size: 6 mm × 6 mm  
Board thickness: 1.6 mm  
JEITA  
TOSHIBA  
3-4E1A  
Weight: 0.023 g (typ.)  
Note 2: Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating temperature / current /  
voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
2005-09  
1
2013-11-01  

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