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CAT9954AWI-T2 PDF预览

CAT9954AWI-T2

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
CATALYST /
页数 文件大小 规格书
16页 267K
描述
8-bit I2C and SMBus I/O Port with Interrupt

CAT9954AWI-T2 数据手册

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CAT9554, CAT9554A  
PIN CONFIGURATION  
SOIC (W)  
TSSOP (Y)  
TQFN (HV4)  
A1 A0  
V
SDA  
CC  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
A0  
A1  
V
CC  
SDA  
SCL  
INT  
12  
11  
10  
9
1
2
3
4
SCL  
INT  
A2  
I/O0  
I/O1  
I/O2  
A2  
I/O0  
I/O1  
I/O2  
I/O3  
I/O7  
I/O6  
I/O5  
I/O4  
I/O7  
I/O6  
V
SS  
I/O3  
V
I/O4 I/O5  
SS  
4 x 4 mm  
Top View  
PIN DESCRIPTION  
SOIC / TSSOP  
TQFN  
PIN NAME  
FUNCTION  
1
2
15  
16  
1
A0  
A1  
Address Input 0  
Address Input 1  
Address Input 2  
3
A2  
4-7  
8
2-5  
6
I/O0-3  
VSS  
I/O4-7  
INT  
SCL  
SDA  
VCC  
Input/Output Port 0 to Input/Output Port 3  
Ground  
9-12  
13  
14  
15  
16  
7-10  
11  
12  
13  
14  
Input/Output Port 4 to Input/Output Port 7  
Interrupt Output (open drain)  
Serial Clock  
Serial Data  
Power Supply  
ABSOLUTE MAXIMUM RATINGS(1)  
VCC with Respect to Ground ............... 0.5V to +6.5V  
VSS Supply Current .......................................... 100mA  
Voltage on Any Pin with  
Package Power Dissipation  
Respect to Ground ........................ 0.5V to +5.5V  
Capability (TA = 25°C) ................................... 1.0W  
DC Current on I/O0 to I/O7 ........................................... +50 mA  
DC Input Current............................................. +20 mA  
VCC Supply Current ............................................ 85mA  
Junction Temperature ..................................... +150°C  
Storage Temperature........................ -65°C to +150°C  
RELIABILITY CHARACTERISTICS  
Symbol  
VZAP(2)  
ILTH(2)(3)  
Parameter  
ESD Susceptibility  
Latch-up  
Reference Test Method  
JEDEC Standard JESD 22  
JEDEC Standard 17  
Min  
2000  
100  
Units  
Volts  
mA  
Notes:  
(1) Stresses above those listed under Absolute Maximum Ratingsmay cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this  
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.  
(2) This parameter is tested initially and after a design or process change that affects the parameter.  
(3) Latch-up protection is provided for stresses up to 100 mA on address and data pins from -1V to V +1V.  
CC  
© 2006 by Catalyst Semiconductor, Inc.  
Characteristics subject to change without notice  
Doc. No. 25088, Rev. B  
2

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