CAT9554, CAT9554A
PIN CONFIGURATION
SOIC (W)
TSSOP (Y)
TQFN (HV4)
A1 A0
V
SDA
CC
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
A0
A1
V
CC
SDA
SCL
INT
12
11
10
9
1
2
3
4
SCL
INT
A2
I/O0
I/O1
I/O2
A2
I/O0
I/O1
I/O2
I/O3
I/O7
I/O6
I/O5
I/O4
I/O7
I/O6
V
SS
I/O3
V
I/O4 I/O5
SS
4 x 4 mm
Top View
PIN DESCRIPTION
SOIC / TSSOP
TQFN
PIN NAME
FUNCTION
1
2
15
16
1
A0
A1
Address Input 0
Address Input 1
Address Input 2
3
A2
4-7
8
2-5
6
I/O0-3
VSS
I/O4-7
INT
SCL
SDA
VCC
Input/Output Port 0 to Input/Output Port 3
Ground
9-12
13
14
15
16
7-10
11
12
13
14
Input/Output Port 4 to Input/Output Port 7
Interrupt Output (open drain)
Serial Clock
Serial Data
Power Supply
ABSOLUTE MAXIMUM RATINGS(1)
VCC with Respect to Ground ............... –0.5V to +6.5V
VSS Supply Current .......................................... 100mA
Voltage on Any Pin with
Package Power Dissipation
Respect to Ground ........................ –0.5V to +5.5V
Capability (TA = 25°C) ................................... 1.0W
DC Current on I/O0 to I/O7 ........................................... +50 mA
DC Input Current............................................. +20 mA
VCC Supply Current ............................................ 85mA
Junction Temperature ..................................... +150°C
Storage Temperature........................ -65°C to +150°C
RELIABILITY CHARACTERISTICS
Symbol
VZAP(2)
ILTH(2)(3)
Parameter
ESD Susceptibility
Latch-up
Reference Test Method
JEDEC Standard JESD 22
JEDEC Standard 17
Min
2000
100
Units
Volts
mA
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) Latch-up protection is provided for stresses up to 100 mA on address and data pins from -1V to V +1V.
CC
© 2006 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
Doc. No. 25088, Rev. B
2