Datasheet > ATF22LV10CZ_10

ATF22LV10CZ_10

更新时间： 2022-10-12 01:15:30

品牌	Logo	应用领域
爱特美尔 - ATMEL		可编程逻辑器件
页数	文件大小	规格书
19页	1886K
描述
High-performance Electrically Erasable Programmable Logic Device

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数据手册

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ATF22LV10CZ_10 数据手册

4.1

DC Characteristics

Symbol Parameter

Condition⁽²⁾

Min

Typ

Max

Units

Input or I/O Low

Leakage Current

I_IL

0  V_IN V_IL(Max)

(V_CC- 0.2)V  V_IN V_CC

-10.0

µA

Input or I/O High

Leakage Current

I_IH

10.0

µA

CZ-25⁽³⁾

Com.

Ind.

50.0

55.0

18.0

19.0

3.0

85.0

90.0

50.0

60.0

25.0

50.0

25.0

50.0

µA

CZ-25⁽³⁾

CQZ-30

CZ-25⁽³⁾

CQZ-30

V_CC= Max

Outputs Open,

f = 15MHz

Clocked Power

Supply Current

I_CC

Com.

Ind.

Com.

Ind.

V_CC= Max

4.0

µA

Power Supply Current,

Standby

I_SB

V_IN= Max

Com.

Ind.

3.0

µA

Outputs Open

4.0

µA

Output Short Circuit

Current

(1)

I_OS

V_IL

V_OUT= 0.5V

-130.0

Input Low Voltage

Input High Voltage

-0.5

2.0

0.8

V_IH

V_CC+ 0.75

V_IN= V_IHor V_IL

V_CC= Min,

V_OL

Output Low Voltage

0.5

_OL= 16mA

V_IN= V_IHor V_IL

V_CCIO= Min,

V_OH

Output High Voltage

2.4

_OH= -2.0mA

V_OH

I_OH= -100 µA

V_CC- 0.2V

Note:

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec

2. For DC characterization, the test condition of V_CC= Max corresponds to 3.6V

3. Shaded devices are becoming obsolete and replaced with CQZ-30 part in green package offering

Atmel ATF22LV10C(Q)Z

0779M–PLD–7/10

1 2 345 6 7...19

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