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AS29F010CW-15/XT PDF预览

AS29F010CW-15/XT

更新时间: 2024-01-03 19:07:12
品牌 Logo 应用领域
AUSTIN /
页数 文件大小 规格书
22页 242K
描述
128K x 8 FLASH UNIFORM SECTOR 5.0V FLASH MEMORY

AS29F010CW-15/XT 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:DIP
包装说明:0.600 INCH, CERAMIC, DIP-32针数:32
Reach Compliance Code:unknownECCN代码:3A001.A.2.C
HTS代码:8542.32.00.51风险等级:5.71
最长访问时间:150 nsJESD-30 代码:R-CDIP-T32
JESD-609代码:e0长度:42.418 mm
内存密度:1048576 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
端子数量:32字数:131072 words
字数代码:128000工作模式:ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:128KX8封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED编程电压:5 V
认证状态:Not Qualified座面最大高度:5.1308 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:CMOS温度等级:MILITARY
端子面层:TIN LEAD端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED类型:NOR TYPE
宽度:15.24 mm

AS29F010CW-15/XT 数据手册

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FLASH  
AS29F010  
Austin Semiconductor, Inc.  
erase circuits are disabled, and the device resets. Subsequent  
writes are ignored until VCC is greater than VLKO. The system  
must provide the proper signals to the control pins to prevent device power-up. No commands are required to retrieve data.  
Reading Array Data  
The device is automatically set to reading array data after  
The device is also ready to read array data after completing an  
Embedded Program or Embedded Erase algorithm.  
unintentional writes when VCC is greater than VLKO  
.
The system must issue the reset command to re-enable the  
device for reading array data if DQ5 goes high, or while in the  
autoselect mode. See the “Reset Command” section, next.  
See also “Requirements for Reading Array Data” in the  
“Device Bus Operations” section for more information. The  
Read Operations table provides the read parameters, and the  
Read Operation Timings diagram shows the timing diagram.  
Write Pulse “Glitch” Protection  
Noise pulses of less than 5ns (typical) on OE\, CE\, or WE\  
do not initiate a write cycle.  
Logical Inhibit  
Write cycles are inhibited by holding any one of OE\ = VIL,  
CE\ = VIH or WE\ = VIH. To initiate a write cycle, CE\ and WE\  
must be a logical zero while OE\ is a logical one.  
Reset Command  
Writing the reset command to the device resets the device  
to reading array data. Address bits are don’t care for this  
command.  
The reset command may be written between the sequence  
cycles in an erase command sequence before erasing begins.  
This resets the device to reading array data. Once erasure  
begins, however, the device ignores reset commands until the  
operation is complete.  
The reset command may be written between the sequence  
cycles in a program command sequence before programming  
begins. This resets the device to reading array data. Once  
programming begins, however, the device ignores reset com-  
mands until the operation is complete.  
The reset command may be written between the sequence  
cycles in an autoselect command sequence. Once in the  
autoselect mode, the reset command must be written to return  
to reading array data.  
Power-Up Write Inhibit  
If WE\ = CE\ = VIL and OE\ = VIH during power up, the  
device does not accept commands on the rising edge of WE\.  
The internal state machine is automatically reset to reading  
array data on power-up.  
COMMAND DEFINITIONS  
Writing specific address and data commands or sequences  
into the command register initiates device operations. The  
Command Definitions table defines the valid register command  
sequences. Writing incorrect address and data values or  
writing them in the improper sequence resets the device to  
reading array data.  
All addresses are latched on the falling edge of WE\ or  
CE\, whichever happens first. Refer to the appropriate timing  
diagrams in the “AC Characteristics” section.  
If DQ5 goes high during a program or erase operation,  
writing the reset command returns the device to reading array  
data.  
TABLE 3: Autoselect Codes (High Voltage Method)  
A8  
to  
A7  
A5  
to  
A2  
A16 to A13 to  
A14 A10  
DESCRIPTION  
CE\  
OE\ WE\  
A9  
A6  
A1  
A0 DQ7 to DQ0  
Manufacturer ID  
Device ID  
L
L
L
L
H
H
X
X
X
X
V
V
X
X
L
L
X
X
L
L
L
01h  
20h  
ID  
H
ID  
01h  
(protected)  
Sector Protection  
Verification  
L
L
H
SA  
X
V
X
L
X
H
L
ID  
00h  
(unprotected)  
NOTE: L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t Care  
AS29F010  
Rev. 0.3 10/02  
6
AustinSemiconductor,Inc.reservestherighttochangeproductsorspecificationswithoutnotice.  

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