5秒后页面跳转
AS29F002B-55PC PDF预览

AS29F002B-55PC

更新时间: 2024-01-16 06:42:40
品牌 Logo 应用领域
ALSC 光电二极管内存集成电路
页数 文件大小 规格书
22页 255K
描述
Flash, 256KX8, 55ns, PDIP32, 0.600 INCH, PLASTIC, DIP-32

AS29F002B-55PC 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:DIP包装说明:0.600 INCH, PLASTIC, DIP-32
针数:32Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.51
风险等级:5.92最长访问时间:55 ns
其他特性:10K WRITE/ERASE CYCLE ENDURANCE启动块:BOTTOM
命令用户界面:YES数据轮询:YES
耐久性:10000 Write/Erase CyclesJESD-30 代码:R-PDIP-T32
JESD-609代码:e0内存密度:2097152 bit
内存集成电路类型:FLASH内存宽度:8
功能数量:1部门数/规模:1,2,1,3
端子数量:32字数:262144 words
字数代码:256000工作模式:ASYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:256KX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:DIP
封装等效代码:DIP32(UNSPEC)封装形状:RECTANGULAR
封装形式:IN-LINE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
编程电压:5 V认证状态:Not Qualified
座面最大高度:4.572 mm部门规模:16K,8K,32K,64K
最大待机电流:0.00001 A子类别:Flash Memories
最大压摆率:0.06 mA最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
切换位:YES类型:NOR TYPE
宽度:15.24 mmBase Number Matches:1

AS29F002B-55PC 数据手册

 浏览型号AS29F002B-55PC的Datasheet PDF文件第1页浏览型号AS29F002B-55PC的Datasheet PDF文件第3页浏览型号AS29F002B-55PC的Datasheet PDF文件第4页浏览型号AS29F002B-55PC的Datasheet PDF文件第5页浏览型号AS29F002B-55PC的Datasheet PDF文件第6页浏览型号AS29F002B-55PC的Datasheet PDF文件第7页 
3UHOLPLQDU\ꢀLQIRUPDWLRQ  
$6ꢁꢂ)ꢃꢃꢁ  
®
)XQFWLRQDOꢀGHVFULSWLRQ  
The AS29F002 is a 2 megabit, 5 volt only Flash memory organized as 256K bytes of 8 bits each. For flexible erase and program capability, the 2  
megabits of data is divided into 7 sectors: one 16K byte, two 8K byte, one 32K byte, and three 64K bytes. The data appears on DQ0–DQ7. The  
AS29F002 is offered in JEDEC standard 40-pin TSOP, 32-pin PLCC, 32-pin TSOP, and 32-pin PDIP packages. This device is designed to be  
programmed and erased in-sytem with a single 5.0V VCC supply. The device can also be reprogrammed in standard EPROM programmers.  
The AS29F002 offers access times of 55/ 70/ 90/ 120 ns, allowing 0-wait state operation of high speed microprocessors. To eliminate bus contention  
the device has separate chip enable (CE), write enable (WE), and output enable (OE) controls.  
The AS29F002 is fully compatible with the JEDEC single power supply Flash standard. Write commands to the command register using standard  
microprocessor write timings. An internal state-machine uses register contents to control the erase and programming circuitry. Write cycles also  
internally latch addresses and data needed for the programming and erase operations. Read data from the device in the same manner as other Flash or  
EPROM devices. Use the program command sequence to invoke the automated on-chip programming algorithm that automatically times the  
program pulse widths and verifies proper cell margin. Use the erase command sequence to invoke the automated on-chip erase algorithm that  
preprograms the sector if it is not already programmed before executing the erase operation, times the erase pulse widths, and verifies proper cell  
margin.  
Boot sector architecture enables the device to boot from either the top (AS29F002T) or bottom (AS29F002B) sector. Sector erase architecture allows  
specified sectors of memory to be erased and reprogrammed without altering data in other sectors. A sector typically erases and verifies within 1.6  
seconds. Hardware sector protection disables both program and erase operations in all or any combination of the seven sectors. The device provides  
background erase with Erase Suspend, which puts erase operations on hold to read data from a sector that is not being erased. The chip erase  
command will automatically erase all unprotected sectors.  
A factory shipped AS29F002 is fully erased (all bits = 1). The programming operation sets bits to 0. Data is programmed into the array one byte at a  
time in any sequence and across sector boundaries. A sector must be erased to change bits from 0 to 1. Erase returns all bytes in a sector to the erased  
state (all bits = 1). Each sector is erased individually with no effect on other sectors.  
The device features single 5.0V power supply operation for both read and write functions. Internally generated and regulated voltages are provided  
for the program and erase operations. A low VCC detector automatically inhibits write operations during power transtitions. DATA polling of DQ7 or  
toggle bit (DQ6) may be used to detect end of program or erase operations. The device automatically resets to the read mode after program/ erase  
operations are completed.  
The AS29F002 resists accidental erasure or spurious programming signals resulting from power transitions. Control register architecture permits  
alteration of memory contents only after successful completion of specific command sequences. During power up, the device is set to read mode  
with all program/ erase commands disabled when VCC is less than VLKO (lockout voltage). The command registers are not affected by noise pulses of  
less than 5 ns on OE, CE, or WE. CE and WE must be logical zero and OE a logical one to initiate write commands.  
When the devices hardware RESET pin is driven low, any program/ erase operation in progress will be terminated and the internal state machine will  
be reset to read mode. If the RESET pin is tied to the system reset circuitry and a system reset occurs during an automated on-chip program/ erase  
algorithm, data in address locations being operated on will become corrupted and require rewriting. Resetting the device enables the systems  
microprocessor to read boot-up firmware from the Flash memory.  
The AS29F002 uses Fowler-Nordheim tunnelling to electrically erase all bits within a sector simultaneously. Bytes are programmed one at a time  
using EPROM programming mechanism of hot electron injection.  
/RJLFꢀEORFNꢀGLDJUDP  
Sector protect  
DQ0–DQ7  
switches  
VCC  
V
RESET  
SS  
Erase voltage  
generator  
Input/ output  
buffers  
Program/ erase  
control  
WE  
Program voltage  
generator  
Command  
register  
STB  
Chip enable  
Output enable  
Logic  
Data latch  
CE  
OE  
Y decoder  
Y gating  
STB  
VCC detector  
Timer  
X decoder  
Cell matrix  
A0A17  
ꢄꢅꢃ  
$//,$1&(ꢀ6(0,&21'8&725  

与AS29F002B-55PC相关器件

型号 品牌 描述 获取价格 数据表
AS29F002B-55SC ETC x8 Flash EEPROM

获取价格

AS29F002B-55TC ALSC Flash, 256KX8, 55ns, PDSO40, 10 X 20 MM, TSOP1-40

获取价格

AS29F002B-70LI ALSC Flash, 256KX8, 70ns, PQCC32, 0.550 X 0.450 INCH, 0.110 INCH HEIGHT, 1.27 MM PITCH, PLASTIC

获取价格

AS29F002B-70SC ETC x8 Flash EEPROM

获取价格

AS29F002B-70SI ETC x8 Flash EEPROM

获取价格

AS29F002B-90SC ETC x8 Flash EEPROM

获取价格