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ADuM3221WBRZ

更新时间： 2024-02-21 01:33:24

品牌	Logo	应用领域
亚德诺 - ADI		驱动器栅极栅极驱动
页数	文件大小	规格书
16页	614K
描述
Isolated, 4 A Dual-Channel Gate Driver

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技术参数
数据手册

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ADuM3221WBRZ 技术参数

是否无铅：	含铅	是否Rohs认证：	符合
生命周期：	Active	包装说明：	SOP, SOP8,.25
针数：	8	Reach Compliance Code：	compliant
ECCN代码：	EAR99	HTS代码：	8542.39.00.01
风险等级：	5.55	Is Samacsys：	N
内置保护：	TRANSIENT; OVER VOLTAGE; THERMAL; UNDER VOLTAGE	高边驱动器：	NO
接口集成电路类型：	BUFFER OR INVERTER BASED PERIPHERAL DRIVER	JESD-30 代码：	R-PDSO-G8
JESD-609代码：	e3	长度：	4.9 mm
湿度敏感等级：	3	功能数量：	2
端子数量：	8	最高工作温度：	125 °C
最低工作温度：	-40 °C	最大输出电流：	0.23 A
标称输出峰值电流：	4 A	封装主体材料：	PLASTIC/EPOXY
封装代码：	SOP	封装等效代码：	SOP8,.25
封装形状：	RECTANGULAR	封装形式：	SMALL OUTLINE
峰值回流温度（摄氏度）：	260	筛选级别：	AEC-Q100
座面最大高度：	1.75 mm	最大压摆率：	17 mA
最大供电电压：	5.5 V	最小供电电压：	3 V
标称供电电压：	3.3 V	电源电压1-最大：	18 V
电源电压1-分钟：	4.5 V	电源电压1-Nom：	10 V
表面贴装：	YES	技术：	CMOS
温度等级：	AUTOMOTIVE	端子面层：	Matte Tin (Sn)
端子形式：	GULL WING	端子节距：	1.27 mm
端子位置：	DUAL	处于峰值回流温度下的最长时间：	30
断开时间：	0.72 µs	接通时间：	0.72 µs
宽度：	3.9 mm	Base Number Matches：	1

ADuM3221WBRZ 数据手册

ADuM3220/ADuM3221

Data Sheet

The values shown in Table 9 summarize the peak voltage for

50 years of service life. In many cases, the approved working

voltage is higher than the 50-year service life voltage. Operation

at these high working voltages can lead to shortened insulation

life in some cases.

POWER CONSUMPTION

The supply current at a given channel of the ADuM3220/

ADuM3221 isolator is a function of the supply voltage, channel

data rate, and channel output load.

For each input channel, the supply current is given by

The insulation lifetime of the ADuM3220/ADuM3221 depends

on the voltage waveform type imposed across the isolation

barrier. The iCoupler insulation structure degrades at different

rates depending on whether the waveform is bipolar ac, unipo-

lar ac, or dc. Figure 24, Figure 25, and Figure 26 illustrate these

different isolation voltage waveforms.

I_DDI= I_DDI(Q)

f ≤ 0.5f_r

f > 0.5f_r

I_DDI= I_DDI(D)× (2f − f_r) + I_DDI(Q)

For each output channel, the supply current is given by

I_DDO= I_DDO(Q)

f ≤ 0.5f_r

_DDO= (I_DDO(D)+ (0.5 × 10⁻³) × C_LV_DDO) × (2f − f_r) + I_DDO(Q)

f > 0.5f_r

A bipolar ac voltage environment is the worst case for the

iCoupler products and is the 50-year operating lifetime that

Analog Devices recommends for maximum working voltage. In

the case of unipolar ac or dc voltage, the stress on the insulation

is significantly lower. This allows operation at higher working

voltages while still achieving a 50-year service life. Any cross-

insulation voltage waveform that does not conform to Figure 25

or Figure 26 should be treated as a bipolar ac waveform, and its

peak voltage should be limited to the 50-year lifetime voltage

value listed in Table 9.

where:

_DDI(D), I_DDO(D)are the input and output dynamic supply currents

per channel (mA/Mbps).

C_Lis the output load capacitance (pF).

V_DDOis the output supply voltage (V).

f is the input logic signal frequency (MHz, half of the input data

rate, NRZ signaling).

f_ris the input stage refresh rate (Mbps).

_DDI(Q), I_DDO(Q)are the specified input and output quiescent supply

Note that the voltage presented in Figure 25 is shown as sinu-

soidal for illustration purposes only. It is meant to represent any

voltage waveform varying between 0 V and some limiting value.

The limiting value can be positive or negative, but the voltage

cannot cross 0 V.

currents (mA).

To calculate the total I_DD1and I_DD2supply current, the supply

currents for each input and output channel corresponding to

_DD1and I_DD2are calculated and totaled.

RATED PEAK VOLTAGE

Figure 9 provides total input I_DD1supply current as a function of

frequency for both input channels. Figure 10 provides total I_DD2

supply current as a function of frequency for both outputs loaded

with 2 nF capacitance.

Figure 24. Bipolar AC Waveform

INSULATION LIFETIME

RATED PEAK VOLTAGE

All insulation structures eventually break down when subjected

to voltage stress over a sufficiently long period. The rate of insu-

lation degradation is dependent on the characteristics of the voltage

waveform applied across the insulation. In addition to the testing

performed by the regulatory agencies, Analog Devices carries out

an extensive set of evaluations to determine the lifetime of the

insulation structure within the ADuM3220/ADuM3221.

Figure 25. Unipolar AC Waveform

RATED PEAK VOLTAGE

Analog Devices performs accelerated life testing using voltage

levels higher than the rated continuous working voltage. Accel-

eration factors for several operating conditions are determined.

These factors allow calculation of the time to failure at the actual

working voltage.

Figure 26. DC Waveform

Rev. C | Page 14 of 16

1...11 12 131415 16

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