Datasheet > ADN2819XCP-RL

ADN2819XCP-RL

更新时间： 2024-01-19 10:27:16

品牌	Logo	应用领域
亚德诺 - ADI		ATM 异步传输模式电信电信集成电路
页数	文件大小	规格书
24页	373K
描述
IC CLOCK RECOVERY CIRCUIT, QCC48, 7 X 7 MM, LFCSP-48, ATM/SONET/SDH IC

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ADN2819XCP-RL 技术参数

是否无铅：	含铅	是否Rohs认证：	不符合
生命周期：	Obsolete	零件包装代码：	QFN
包装说明：	7 X 7 MM, LFCSP-48	针数：	48
Reach Compliance Code：	not_compliant	HTS代码：	8542.39.00.01
风险等级：	5.86	应用程序：	SONET;SDH
JESD-30 代码：	S-XQCC-N48	JESD-609代码：	e0
长度：	7 mm	功能数量：	1
端子数量：	48	最高工作温度：	85 °C
最低工作温度：	-40 °C	封装主体材料：	UNSPECIFIED
封装代码：	VQCCN	封装形状：	SQUARE
封装形式：	CHIP CARRIER, VERY THIN PROFILE	峰值回流温度（摄氏度）：	NOT SPECIFIED
认证状态：	Not Qualified	座面最大高度：	0.9 mm
标称供电电压：	3.3 V	表面贴装：	YES
电信集成电路类型：	ATM/SONET/SDH CLOCK RECOVERY CIRCUIT	温度等级：	INDUSTRIAL
端子面层：	Tin/Lead (Sn/Pb)	端子形式：	NO LEAD
端子节距：	0.5 mm	端子位置：	QUAD
处于峰值回流温度下的最长时间：	NOT SPECIFIED	宽度：	7 mm
Base Number Matches：	1

ADN2819XCP-RL 数据手册

ADN2819

DEFINITION OF TERMS

MAXIMUM, MINIMUM, AND TYPICAL

SPECIFICATIONS

SINGLE-ENDED VS. DIFFERENTIAL

AC-coupling is typically used to drive the inputs to the

quantizer. The inputs are internally dc biased to a common-

mode potential of ~0.6 V. Driving the ADN2819 single-ended

and observing the quantizer input with an oscilloscope probe at

the point indicated in Figure 9 shows a binary signal with an

average value equal to the common-mode potential and

instantaneous values above and below the average value. It is

convenient to measure the peak-to-peak amplitude of this

signal and to call the minimum required value the quantizer

sensitivity. Referring to Figure 8, since both positive and

negative offsets need to be accommodated, the sensitivity is

twice the overdrive.

Specifications for every parameter are derived from statistical

analyses of data taken on multiple devices from multiple wafer

lots. Typical specifications are the mean of the distribution of

the data for that parameter. If a parameter has a maximum (or a

minimum), that value is calculated by adding to (or subtracting

from) the mean six times the standard deviation of the

distribution. This procedure is intended to tolerate production

variations. If the mean shifts by 1.5 standard deviations, the

remaining 4.5 standard deviations still provide a failure rate of

only 3.4 parts per million. For all tested parameters, the test

limits are guardbanded to account for tester variation and

therefore guarantee that no device is shipped outside of data

sheet specifications.

10mV p-p

VREF

INPUT SENSITIVITY AND INPUT OVERDRIVE

SCOPE

PROBE

ADN2819

Sensitivity and overdrive specifications for the quantizer involve

offset voltage, gain, and noise. The relationship between the

logic output of the quantizer and the analog voltage input is

shown in Figure 8. For a sufficiently large positive input voltage,

the output is always Logic 1; similarly for negative inputs, the

output is always Logic 0. However, the transitions between

output Logic Levels 1 and 0 are not at precisely defined input

voltage levels, but occur over a range of input voltages. Within

this zone of confusion, the output may be either 1 or 0, or it may

even fail to attain a valid logic state. The width of this zone is

determined by the input voltage noise of the quantizer. The

center of the zone of confusion is the quantizer input offset

voltage. Input overdrive is the magnitude of signal required to

guarantee the correct logic level with 1 × 10^–10confidence level.

QUANTIZER

50Ω 50Ω

VREF

Figure 9. Single-Ended Sensitivity Measurement

5mV p-p

VREF

SCOPE

PROBE

ADN2819

OUTPUT

NOISE

QUANTIZER

NIN

50Ω 50Ω

VREF

INPUT (V p-p)

OFFSET

OVERDRIVE

Figure 10. Differential Sensitivity Measurement

SENSITIVITY

(2× OVERDRIVE)

Driving the ADN2819 differentially (see Figure 10), sensitivity

seems to improve by observing the quantizer input with an

oscilloscope probe. This is an illusion caused by the use of a

single-ended probe. A 5 mV p-p signal appears to drive the

ADN2819 quantizer. However, the single-ended probe measures

only half the signal. The true quantizer input signal is twice this

value since the other quantizer input is complementary to the

signal being observed.

Figure 8. Input Sensitivity and Input Overdrive

Rev. B | Page 9 of 24

1...6 7 8910 11 12...24

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