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AD586ARZ1

更新时间: 2022-04-12 17:18:23
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
16页 479K
描述
High Precision 5 V Reference

AD586ARZ1 数据手册

 浏览型号AD586ARZ1的Datasheet PDF文件第6页浏览型号AD586ARZ1的Datasheet PDF文件第7页浏览型号AD586ARZ1的Datasheet PDF文件第8页浏览型号AD586ARZ1的Datasheet PDF文件第10页浏览型号AD586ARZ1的Datasheet PDF文件第11页浏览型号AD586ARZ1的Datasheet PDF文件第12页 
AD586  
5V  
200mV  
1µS  
1µS  
5V  
50mV  
V
L
C
L
= 0  
V
OUT  
C
L
= 1000pF  
Figure 16. Output Response with Capacitive Load  
Figure 13. Large-Scale Transient Response  
LOAD REGULATION  
2µS  
5V  
1mV  
The AD586 has excellent load regulation characteristics. Figure 17  
shows that varying the load several mA changes the output by a  
few µV. The AD586 has somewhat better load regulation per-  
formance sourcing current than sinking current.  
V
L
V  
(µV)  
OUT  
V
OUT  
1000  
500  
2
4
6
8
10 LOAD (mA)  
0
–6  
–4  
–2  
–500  
Figure 14. Fine-Scale Setting for Transient Load  
–1000  
In some applications, a varying load may be both resistive and  
capacitive in nature, or the load may be connected to the AD586  
by a long capacitive cable.  
Figure 17. Typical Load Regulation Characteristics  
Figure 15 and Figure 16 display the output amplifier  
characteristics driving a 1000 pF, 0 mA to 10 mA load.  
TEMPERATURE PERFORMANCE  
The AD586 is designed for precision reference applications  
where temperature performance is critical. Extensive tempera-  
ture testing ensures that the device maintains a high level of  
performance over the operating temperature range.  
V
OUT  
C
L
3.5V  
500  
1000pF  
5V  
0V  
V
L
AD586  
Some confusion exists with defining and specifying reference  
voltage error over temperature. Historically, references have  
been characterized using a maximum deviation per degree  
Celsius, that is, ppm/°C. However, because of nonlinearities in  
temperature characteristics that originated in standard Zener  
references (such as “S” type characteristics), most manufacturers  
have begun to use a maximum limit error band approach to  
specify devices. This technique involves measuring the output at  
three or more different temperatures to specify an output volt-  
age error band.  
Figure 15. Capacitive Load Transient Response Test Circuit  
Rev. G | Page 9 of 16  
 
 
 
 

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