AD5203
NOTES
1Typicals represent average readings at +25°C and VDD = +5 V.
2Resistor position nonlinearity error R-INL is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper posi-
tions. R-DNL measures the relative step change from ideal between successive tap positions. Parts are guaranteed monotonic. See Figure 27 test circuit. I W = VDD/R
for both VDD = +3 V or VDD = +5 V.
3VAB = VDD, Wiper (VW) = No connect.
4INL and DNL are measured at VW with the RDAC configured as a potentiometer divider similar to a voltage output D/A converter. V A = VDD and VB = 0 V.
DNL specification limits of ±1 LSB maximum are guaranteed monotonic operating conditions. See Figure 26 test circuit.
5Resistor terminals A, B, W have no limitations on polarity with respect to each other.
6Guaranteed by design and not subject to production test.
7Measured at the AX terminals. All AX terminals are open-circuited in shutdown mode.
8Worst case supply current consumed when all logic-input levels set at 2.4 V, standard characteristic of CMOS logic. See Figure 19 for a plot of I DD vs. logic voltage
inputs result in minimum power dissipation.
9PDISS is calculated from (IDD × VDD). CMOS logic level inputs result in minimum power dissipation.
10All dynamic characteristics use VDD = +5 V.
11Measured at a VW pin where an adjacent VW pin is making a full-scale voltage change.
12See timing diagrams for location of measured values. All input control voltages are specified with t R = tF = 1 ns (10% to 90% of VDD) and timed from a voltage level
of 1.6 V. Switching characteristics are measured using both VDD = +3 V or +5 V. Input logic should have a 1 V/µs minimum slew rate.
13Propagation delay depends on value of VDD, RL and CL. See Operation section.
ABSOLUTE MAXIMUM RATINGS*
(TA = +25°C, unless otherwise noted)
1
SDI
A1 A0 D5 D4 D3 D2 D1 D0
0
1
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . .–0.3 V, +8 V
VA, VB, VW to GND . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, VDD
IAB, IAW, IBW . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
Digital Input and Output Voltage to GND . . . . . . . 0 V, +8 V
Operating Temperature Range . . . . . . . . . . . –40°C to +85°C
Maximum Junction Temperature (TJ MAX) . . . . . . . .+150°C
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . .+300°C
Package Power Dissipation . . . . . . . . . . . . . . (TJ max–TA)/θJA
Thermal Resistance θJA
CLK
0
1
DAC REGISTER LOAD
CS
0
V
DD
V
OUT
0V
Figure 1a. Timing Diagram
1
0
SDI
(DATA IN)
Ax OR Dx
Ax OR Dx
tDS
P-DIP (N-24) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63°C/W
SOIC (SOL-24) . . . . . . . . . . . . . . . . . . . . . . . . . . . 70°C/W
TSSOP-24 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143°C/W
tDH
1
0
SDO
(DATA OUT)
A'x OR D'x
A'x OR D'x
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
tPD
tPD
MIN
MAX
tCH
tCS1
1
0
CLK
tCL
tCSH
tCSS
1
0
tCSW
CS
Table I. Serial-Data Word Format
tS
؎1 LSB
V
DD
ADDR
B7
DATA
B5
V
OUT
؎ 1 LSB ERROR BAND
0V
B6
B4
B3
B2
B1
B0
Figure 1b. Detail Timing Diagram
A1
A0
D5
D4
D3
D2
D1
D0
LSB
20
MSB LSB
MSB
27 26
25
tRS
1
RS
0
tS
؎1 LSB
V
DD
V
OUT
؎1 LSB ERROR BAND
0V
Figure 1c. Reset Timing Diagram
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD5203 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. 0
–3–