Product specification
9
12
SERIES
0201 to 2512
AC
Chip Resistor Surface Mount
TESTS AND REQUIREMENTS
Table 4 Test condition, procedure and requirements
TEST
TEST METHOD
PROCEDURE
REQUIREMENTS
High Temperature
Exposure
AEC-Q200 Test 3
±(1.0%+0.05Ω) for D/F tol
±(2.0%+0.05Ω) for J tol
<50 mΩ for Jumper
1,000 hours at TA = 155 °C, unpowered
MIL-STD-202 Method 108
Moisture
Resistance
AEC-Q200 Test 6
Each temperature / humidity cycle is defined at
8 hours (method 106F), 3 cycles / 24 hours for
10d. with 25 °C / 65 °C 95% R.H, without steps
7a & 7b, unpowered
±(0.5%+0.05Ω) for D/F tol
±(2.0%+0.05Ω) for J tol
<100 mΩ for Jumper
MIL-STD-202 Method 106
Biased
Humidity
AEC-Q200 Test 7
1,000 hours; 85 °C / 85% RH
10% of operating power
±(1.0%+0.05Ω) for D/F tol
±(3.0%+0.05Ω) for J tol
<100 mΩ for Jumper
MIL-STD-202 Method 103
Measurement at 24±4 hours after test conclusion.
Operational Life
AEC-Q200 Test 8
1,000 hours at 125 °C, derated voltage applied for ±(1.0%+0.05Ω) for D/F tol
1.5 hours on, 0.5 hour off, still-air required
MIL-STD-202 Method 108
±(3.0%+0.05Ω) for J tol
<100 mΩ for Jumper
Resistance to
Soldering Heat
AEC-Q200 Test 15
Condition B, no pre-heat of samples
±(0.5%+0.05Ω) for D/F tol
±(1.0%+0.05Ω) for J tol
<50 mΩ for Jumper
MIL-STD-202 Method 210
Lead-free solder, 260± 5 °C, 10±1 seconds
immersion time
Procedure 2 for SMD: devices fluxed and
cleaned with isopropanol
No visible damage
Thermal Shock
AEC-Q200 Test 16
-55/+125 °C
±(0.5%+0.05Ω) for D/F tol
±(1.0%+0.05Ω) for J tol
<50 mΩ for Jumper
MIL-STD-202 Method 107
Number of cycles is 300. Devices mounted
Maximum transfer time is 20 seconds.
Dwell time is 15 minutes. Air – Air
ESD
AEC-Q200 Test 17
AEC-Q200-002
Human Body Model,
1 pos. + 1 neg. discharges
0201: 500V
±(3.0%+0.05 Ω)
<50 mΩ for Jumper
0402/0603: 1KV
0805 and above: 2KV
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Jun. 20, 2017 V.6