Philips Semiconductors
Product specification
2-input OR gate
74HC1G32; 74HCT1G32
DC CHARACTERISTICS
Family 74HC1G
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
TEST CONDITIONS Tamb (°C)
SYMBOL
PARAMETER
−40 to +85
−40 to +125
MIN. MAX.
1.5
UNIT
VCC
(V)
OTHER
MIN. TYP.(1) MAX.
VIH
HIGH-level input voltage
2.0
1.5
3.15
4.2
−
1.2
2.4
3.2
0.8
2.1
2.8
2.0
−
−
V
V
V
V
V
V
V
4.5
6.0
2.0
4.5
6.0
2.0
−
3.15
4.2
−
−
−
−
VIL
LOW-level input voltage
0.5
1.35
1.8
−
0.5
1.35
1.8
−
−
−
−
−
VOH
HIGH-level output
voltage
VI = VIH or VIL;
IO = −20 µA
1.9
1.9
VI = VIH or VIL;
IO = −20 µA
4.5
6.0
4.5
6.0
2.0
4.5
6.0
4.5
6.0
6.0
4.4
5.9
4.13
5.63
−
4.5
6.0
4.32
5.81
0
−
4.4
5.9
3.7
5.2
−
−
V
V
V
V
V
V
V
V
V
VI = VIH or VIL;
IO = −20 µA
−
−
VI = VIH or VIL;
IO = −2.0 mA
−
−
VI = VIH or VIL;
IO = −2.6 mA
−
−
VOL
LOW-level output voltage VI = VIH or VIL;
0.1
0.1
0.1
0.33
0.33
0.1
0.1
0.1
0.4
0.4
IO = 20 µA
VI = VIH or VIL;
IO = 20 µA
−
0
−
VI = VIH or VIL;
IO = 20 µA
−
0
−
VI = VIH or VIL;
IO = 2.0 mA
−
0.15
0.16
−
VI = VIH or VIL;
IO = 2.6 mA
−
−
ILl
input leakage current
VI = VCC or GND
−
−
−
−
1.0
10
−
−
1.0
20
µA
µA
ICC
quiescent supply current VI = VCC or GND; 6.0
IO = 0
Note
1. All typical values are measured at Tamb = 25 °C.
2002 May 15
5