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71V25781S166BQI PDF预览

71V25781S166BQI

更新时间: 2023-02-26 14:51:56
品牌 Logo 应用领域
艾迪悌 - IDT 时钟静态存储器内存集成电路
页数 文件大小 规格书
22页 627K
描述
Cache SRAM, 256KX18, 3.5ns, CMOS, PBGA165, FBGA-165

71V25781S166BQI 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:TBGA, BGA165,11X15,40针数:165
Reach Compliance Code:not_compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.91
最长访问时间:3.5 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):166 MHzI/O 类型:COMMON
JESD-30 代码:R-PBGA-B165JESD-609代码:e0
长度:15 mm内存密度:4718592 bit
内存集成电路类型:CACHE SRAM内存宽度:18
湿度敏感等级:3功能数量:1
端子数量:165字数:262144 words
字数代码:256000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:256KX18输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, THIN PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):225电源:2.5,3.3 V
认证状态:Not Qualified座面最大高度:1.2 mm
最大待机电流:0.035 A最小待机电流:3.14 V
子类别:SRAMs最大压摆率:0.33 mA
最大供电电压 (Vsup):3.465 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn63Pb37)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:20宽度:13 mm
Base Number Matches:1

71V25781S166BQI 数据手册

 浏览型号71V25781S166BQI的Datasheet PDF文件第2页浏览型号71V25781S166BQI的Datasheet PDF文件第3页浏览型号71V25781S166BQI的Datasheet PDF文件第4页浏览型号71V25781S166BQI的Datasheet PDF文件第5页浏览型号71V25781S166BQI的Datasheet PDF文件第6页浏览型号71V25781S166BQI的Datasheet PDF文件第7页 
128K X 36, 256K X 18  
IDT71V25761S  
IDT71V25781S  
IDT71V25761SA  
IDT71V25781SA  
3.3VSynchronousSRAMs  
2.5V I/O, Pipelined Outputs,  
Burst Counter, Single Cycle Deselect  
Features  
Description  
128K x 36, 256K x 18 memory configurations  
TheIDT71V25761/781arehigh-speedSRAMs organizedas 128K  
x 36/256K x 18. The IDT71V25761/781 SRAMs contain write, data,  
addressandcontrolregisters. InternallogicallowstheSRAMtogenerate  
aself-timedwritebaseduponadecisionwhichcanbeleftuntiltheendof  
thewritecycle.  
Supports high system speed:  
Commercial:  
– 200MHz 3.1ns clock access time  
CommercialandIndustrial:  
– 183MHz 3.3ns clock access time  
– 166MHz 3.5ns clock access time  
LBO input selects interleaved or linear burst mode  
Theburstmodefeatureoffersthehighestlevelofperformancetothe  
systemdesigner,astheIDT71V25761/718canprovidefourcyclesofdata  
forasingleaddress presentedtotheSRAM. Aninternalburstaddress  
Self-timedwritecyclewithglobalwritecontrol(GW),bytewrite counteracceptsthefirstcycleaddressfromtheprocessor,initiatingthe  
enable (BWE), and byte writes (BWx)  
3.3V core power supply  
Power down controlled by ZZ input  
2.5V I/O  
Optional - Boundary Scan JTAG Interface (IEEE 1149.1  
Compliant)  
Packaged in a JEDEC Standard 100-pin plastic thin quad  
accesssequence.Thefirstcycleofoutputdatawillbepipelinedforone  
cycle before it is available on the next rising clock edge. If burst mode  
operationisselected(ADV=LOW),thesubsequentthreecyclesofoutput  
datawillbeavailabletotheuseronthenextthreerisingclockedges. The  
orderofthesethreeaddressesaredefinedbytheinternalburstcounter  
andthe LBO inputpin.  
TheIDT71V25761/781SRAMsutilizeIDT’slatesthigh-performance  
flatpack(TQFP),119ballgridarray(BGA)and165finepitchball CMOSprocessandarepackagedinaJEDECstandard14mmx20mm  
grid array  
100-pinthinplasticquadflatpack(TQFP)aswellasa119 ballgridarray  
(BGA) and 165 fine pitch ball grid array (fBGA).  
PinDescriptionSummary  
A0-A17  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
Synchronous  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
N/A  
Chip Enable  
CE  
CS  
0
, CS  
1
Chip Selects  
Output Enable  
OE  
GW  
Global Write Enable  
Byte Write Enable  
Individual Byte Write Selects  
Clock  
BWE  
BW , BW  
(1)  
1
2
, BW  
3
, BW  
4
CLK  
Burst Address Advance  
Address Status (Cache Controller)  
Address Status (Processor)  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
Synchronous  
Synchronous  
Synchronous  
DC  
ADV  
ADSC  
ADSP  
LBO  
TMS  
TDI  
Synchronous  
Synchronous  
N/A  
TCK  
TDO  
TRST  
ZZ  
Test Clock  
Test Data Output  
Synchronous  
Asynchronous  
Asynchronous  
Synchronous  
N/A  
JTAG Reset (Optional)  
Sleep Mode  
I/O  
0
-I/O31, I/OP1-I/OP4  
DD, VDDQ  
SS  
Data Input / Output  
Core Power, I/O Power  
Ground  
V
Supply  
Supply  
V
N/A  
5297 tbl 01  
NOTE:  
1. BW3 and BW4 are not applicable for the IDT71V25781.  
MARCH 2009  
1
©2000IntegratedDeviceTechnology,Inc.  
DSC-5297/03  

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