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5962-9958501Q9A PDF预览

5962-9958501Q9A

更新时间: 2024-02-04 17:14:05
品牌 Logo 应用领域
ACTEL 可编程逻辑
页数 文件大小 规格书
217页 1554K
描述
Field Programmable Gate Array, 36000 Gates, 2414-Cell, CMOS, DIE-253

5962-9958501Q9A 技术参数

生命周期:Transferred包装说明:DIE-253
Reach Compliance Code:unknown风险等级:5.81
其他特性:ALSO OPERATES AT 5V SUPPLYJESD-30 代码:R-XUUC-N253
JESD-609代码:e0等效关口数量:36000
输入次数:202逻辑单元数量:2414
输出次数:202端子数量:253
最高工作温度:125 °C最低工作温度:-55 °C
组织:36000 GATES封装主体材料:UNSPECIFIED
封装代码:DIE封装等效代码:DIE OR CHIP
封装形状:RECTANGULAR封装形式:UNCASED CHIP
电源:3.3/5 V可编程逻辑类型:FIELD PROGRAMMABLE GATE ARRAY
认证状态:Not Qualified筛选级别:MIL-PRF-38535 Class Q
子类别:Field Programmable Gate Arrays最大供电电压:3.6 V
最小供电电压:3 V标称供电电压:3.3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:TIN LEAD
端子形式:NO LEAD端子位置:UPPER
Base Number Matches:1

5962-9958501Q9A 数据手册

 浏览型号5962-9958501Q9A的Datasheet PDF文件第1页浏览型号5962-9958501Q9A的Datasheet PDF文件第2页浏览型号5962-9958501Q9A的Datasheet PDF文件第3页浏览型号5962-9958501Q9A的Datasheet PDF文件第5页浏览型号5962-9958501Q9A的Datasheet PDF文件第6页浏览型号5962-9958501Q9A的Datasheet PDF文件第7页 
MIL-PRF-38535K  
CONTENTS  
PARAGRAPH  
PAGE  
6.4.16 Die type............................................................................................................................................................36  
6.4.17 Radiation hardness assurance (RHA)..............................................................................................................36  
6.4.18 Electrostatic discharge (ESD) sensitivity..........................................................................................................36  
6.4.19 Package family.................................................................................................................................................36  
6.4.20 Technology flow ...............................................................................................................................................36  
6.4.21 Qualified Manufacturer's Listing (QML)............................................................................................................36  
6.4.22 Third party design center..................................................................................................................................36  
6.4.23 Radiation source of supply (RSS) ....................................................................................................................36  
6.4.24 Form.................................................................................................................................................................36  
6.4.25 Fit.....................................................................................................................................................................36  
6.4.26 Function ...........................................................................................................................................................36  
6.4.27 Class M............................................................................................................................................................37  
6.4.28 Class N.............................................................................................................................................................37  
6.4.29 Class Q ............................................................................................................................................................37  
6.4.30 Class V.............................................................................................................................................................37  
6.4.31 Class Y.............................................................................................................................................................37  
6.4.32 Class B.............................................................................................................................................................37  
6.4.33 Class S.............................................................................................................................................................37  
6.4.34 Class T.............................................................................................................................................................37  
6.4.35 Qualified manufacturer’s line............................................................................................................................37  
6.4.36 Test optimization..............................................................................................................................................37  
6.4.37 Audit team........................................................................................................................................................37  
6.4.38 Class level B ....................................................................................................................................................37  
6.4.39 Class level S ....................................................................................................................................................37  
6.4.40 Class level vs Class .........................................................................................................................................38  
6.4.41 Second party facility.........................................................................................................................................38  
6.4.42 Third party facility.............................................................................................................................................38  
6.4.43 New technology................................................................................................................................................38  
6.4.44 Mature technology............................................................................................................................................38  
6.4.45 Lot date code ...................................................................................................................................................38  
6.4.46 Storage temperature ........................................................................................................................................38  
6.4.47 Multi-product wafer(MPW)................................................................................................................................38  
6.4.48 Package integrity demonstration test plan(PIDTP)...........................................................................................38  
6.5 Discussion.............................................................................................................................................................39  
6.6 Additional reference documents............................................................................................................................41  
6.7 Subject term (key word) listing ..............................................................................................................................42  
6.8 List of acronyms....................................................................................................................................................43  
6.9 Environmentally preferable material......................................................................................................................45  
6.10 Changes from previous issue..............................................................................................................................45  
A.1 SCOPE.................................................................................................................................................................46  
A.1.1 Scope.................................................................................................................................................................46  
A.2 APPLICABLE DOCUMENTS................................................................................................................................46  
A.2.1 General..............................................................................................................................................................46  
A.2.2 Government documents.....................................................................................................................................46  
A.2.2.1 Specifications, standards, and handbooks......................................................................................................46  
A.2.2.2 Other Government documents, drawings, and publications............................................................................47  
A.2.3 Non-Government publications ...........................................................................................................................47  
A.2.4 Order of precedence..........................................................................................................................................48  
A.3 REQUIREMENTS.................................................................................................................................................48  
A.3.1 General..............................................................................................................................................................48  
A.3.1.1 Reference to device specification or drawing..................................................................................................48  
A.3.1.2 Conflicting requirements .................................................................................................................................49  
A.3.1.3 Terms, definitions, symbols and requirements................................................................................................49  
A.3.1.3.1 Microelectronics...........................................................................................................................................49  
A.3.1.3.2 Element (of a microcircuit or integrated circuit)............................................................................................49  
iv  

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