Datasheet > 5962-9875901QXX

5962-9875901QXX

更新时间： 2023-01-02 16:18:04

品牌	Logo	应用领域
ACTEL		栅
页数	文件大小	规格书
98页	2005K
描述
Field Programmable Gate Array, 1362 CLBs, 10000 Gates, CMOS, CQFP84, CERAMIC, QFP-84

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5962-9875901QXX 数据手册

Actel MIL-STD-883 Product Flow

883—Class B

Requirement

Step

Screen

883 Method

Internal Visual

2010, Test Condition B

1010, Test Condition C

100%

Temperature Cycling

Constant Acceleration

2001, Test Condition D or E,

Y₁, Orientation Only

Seal

1014

a. Fine

b. Gross

100%

Visual Inspection

2009

100%

Pre-Burn-In

Electrical Parameters

In accordance with applicable Actel

device specification

Burn-in Test

1015, Condition D,

160 hours @ 125°C or 80 hours @ 150°C

100%

Interim (Post-Burn-In)

Electrical Parameters

In accordance with applicable Actel

device specification

Percent Defective Allowable

Final Electrical Test

All Lots

10.

In accordance with applicable Actel

device specification, which includes a, b, and c:

a. Static Tests

100%

(1) 25°C

(Subgroup 1, Table I)

(2) –55°C and +125°C

(Subgroups 2, 3, Table I)

5005

b. Functional Tests

(1) 25°C

(Subgroup 7, Table I)

(2) –55°C and +125°C

(Subgroups 8A and 8B, Table I)

5005

c. Switching Tests at 25°C

(Subgroup 9, Table I)

100%

5005

2009

11.

External Visual

Note: When Destructive Physical Analysis (DPA) is performed on Class B devices, the step coverage requirement as specified in Method 2018

must be waived.

1...5 6 789 10 11...98

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