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5962-9451801MLA PDF预览

5962-9451801MLA

更新时间: 2024-01-10 17:44:46
品牌 Logo 应用领域
亚德诺 - ADI 信息通信管理转换器
页数 文件大小 规格书
12页 184K
描述
LC2MOS Complete, Dual 12-Bit MDAC, (8 + 4) Loading Structure

5962-9451801MLA 技术参数

是否无铅:含铅是否Rohs认证:不符合
生命周期:Active零件包装代码:DIP
包装说明:DIP, DIP24,.3针数:24
Reach Compliance Code:not_compliantECCN代码:3A001.A.2.C
HTS代码:8542.39.00.01风险等级:5.06
Is Samacsys:N最大模拟输出电压:10 V
最小模拟输出电压:-10 V转换器类型:D/A CONVERTER
输入位码:BINARY, OFFSET BINARY输入格式:PARALLEL, WORD
JESD-30 代码:R-GDIP-T24JESD-609代码:e0
最大线性误差 (EL):0.0244%标称负供电电压:-15 V
位数:12功能数量:2
端子数量:24最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装等效代码:DIP24,.3
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT APPLICABLE电源:+-15 V
认证状态:Qualified筛选级别:MIL-STD-883
座面最大高度:5.715 mm标称安定时间 (tstl):3 µs
子类别:Other Converters最大压摆率:10 mA
标称供电电压:15 V表面贴装:NO
技术:BICMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT APPLICABLE宽度:7.62 mm
Base Number Matches:1

5962-9451801MLA 数据手册

 浏览型号5962-9451801MLA的Datasheet PDF文件第1页浏览型号5962-9451801MLA的Datasheet PDF文件第2页浏览型号5962-9451801MLA的Datasheet PDF文件第3页浏览型号5962-9451801MLA的Datasheet PDF文件第5页浏览型号5962-9451801MLA的Datasheet PDF文件第6页浏览型号5962-9451801MLA的Datasheet PDF文件第7页 
AD7837/AD7847  
Channel-to-Channel Isolation  
TERMINOLOGY  
This is an ac error due to capacitive feedthrough from the VREF  
input on one DAC to VOUT on the other DAC. It is measured  
with the DAC latches loaded with all 0s.  
Relative Accuracy (Linearity)  
Relative accuracy, or endpoint linearity, is a measure of the  
maximum deviation of the DAC transfer function from a  
straight line passing through the endpoints. It is measured after  
allowing for zero and full-scale errors and is expressed in LSBs  
or as a percentage of full-scale reading.  
Digital Feedthrough  
Digital feedthrough is the glitch impulse injected from the digi-  
tal inputs to the analog output when the data inputs change state,  
but the data in the DAC latches is not changed.  
Differential Nonlinearity  
Differential nonlinearity is the difference between the measured  
change and the ideal 1 LSB change between any two adjacent  
codes. A specified differential nonlinearity of 1 LSB or less  
over the operating temperature range ensures monotonicity.  
For the AD7837, it is measured with LDAC held high. For the  
AD7847, it is measured with CSA and CSB held high.  
Digital Crosstalk  
Digital crosstalk is the glitch impulse transferred to the output  
of one converter due to a change in digital code on the DAC  
latch of the other converter. It is specified in nV secs.  
Zero Code Offset Error  
Zero code offset error is the error in output voltage from VOUTA  
or VOUTB with all 0s loaded into the DAC latches. It is due to a  
combination of the DAC leakage current and offset errors in the  
output amplifier.  
Digital-to-Analog Glitch Impulse  
This is the voltage spike that appears at the output of the DAC  
when the digital code changes, before the output settles to its  
final value. The energy in the glitch is specified in nV secs and is  
measured for a 1 LSB change around the major carry transition  
(0111 1111 1111 to 1000 0000 0000 and vice versa).  
Gain Error  
Gain error is a measure of the output error between an ideal  
DAC and the actual device output with all 1s loaded. It does  
not include offset error.  
Unity Gain Small Signal Bandwidth  
Total Harmonic Distortion  
This is the ratio of the root-mean-square (rms) sum of the har-  
monics to the fundamental, expressed in dBs.  
This is the frequency at which the small signal voltage output  
from the output amplifier is 3 dB below its dc level. It is mea-  
sured with the DAC latch loaded with all 1s.  
Multiplying Feedthrough Error  
Full Power Bandwidth  
This is an ac error due to capacitive feedthrough from the VREF  
input to VOUT of the same DAC when the DAC latch is loaded  
with all 0s.  
This is the maximum frequency for which a sinusoidal input  
signal will produce full output at rated load with a distortion  
less than 3%. It is measured with the DAC latch loaded with  
all 1s.  
AD7837 PIN FUNCTION DESCRIPTION (DIP AND SOIC PIN NUMBERS)  
Description  
Pin  
Mnemonic  
1
2
3
4
5
6
CS  
Chip Select. Active low logic input. The device is selected when this input is active.  
Amplifier Feedback Resistor for DAC A.  
Reference Input Voltage for DAC A. This may be an ac or dc signal.  
Analog Output Voltage from DAC A.  
Analog Ground for DAC A.  
Positive Power Supply.  
RFBA  
VREFA  
VOUTA  
AGNDA  
VDD  
7
VSS  
Negative Power Supply.  
8
9
10  
11  
12  
13  
AGNDB  
VOUTB  
VREFB  
DGND  
RFBB  
Analog Ground for DAC B.  
Analog Output Voltage from DAC B.  
Reference Input Voltage for DAC B. This may be an ac or dc signal.  
Digital Ground. Ground reference for digital circuitry.  
Amplifier Feedback Resistor for DAC B.  
WR  
Write Input. WR is an active low logic input which is used in conjunction with CS, A0 and A1 to  
write data to the input latches.  
14  
LDAC  
DAC Update Logic Input. Data is transferred from the input latches to the DAC latches when LDAC  
is taken low.  
15  
16  
17–20  
21–24  
A1  
A0  
DB7–DB4  
DB3–DB0  
Address Input. Most significant address input for input latches (see Table II).  
Address Input. Least significant address input for input latches (see Table II).  
Data Bit 7 to Data Bit 4.  
Data Bit 3 to Data Bit 0 (LSB) or Data Bit 11 (MSB) to Data Bit 8.  
–4–  
REV. C  

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