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5962-9089904QYA PDF预览

5962-9089904QYA

更新时间: 2024-01-20 16:32:44
品牌 Logo 应用领域
其他 - ETC 闪存可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
27页 208K
描述
MICROCIRCUIT, MEMORY, DIGITAA, CMOS, 128K X 8 BIT FLASH EEPROM, MONOLITHIC SILICON

5962-9089904QYA 技术参数

生命周期:Obsolete零件包装代码:QFJ
包装说明:QCCN,针数:32
Reach Compliance Code:unknownECCN代码:3A001.A.2.C
HTS代码:8542.32.00.51风险等级:5.58
Is Samacsys:N最长访问时间:120 ns
JESD-30 代码:R-CQCC-N32JESD-609代码:e0
内存密度:1048576 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
端子数量:32字数:131072 words
字数代码:128000工作模式:ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:128KX8封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:QCCN封装形状:RECTANGULAR
封装形式:CHIP CARRIER并行/串行:PARALLEL
编程电压:12 V认证状态:Not Qualified
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:TIN LEAD端子形式:NO LEAD
端子位置:QUADBase Number Matches:1

5962-9089904QYA 数据手册

 浏览型号5962-9089904QYA的Datasheet PDF文件第1页浏览型号5962-9089904QYA的Datasheet PDF文件第2页浏览型号5962-9089904QYA的Datasheet PDF文件第3页浏览型号5962-9089904QYA的Datasheet PDF文件第5页浏览型号5962-9089904QYA的Datasheet PDF文件第6页浏览型号5962-9089904QYA的Datasheet PDF文件第7页 
2. APPLICABLE DOCUMENTS  
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a  
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in  
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the  
solicitation.  
SPECIFICATION  
DEPARTMENT OF DEFENSE  
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.  
STANDARDS  
DEPARTMENT OF DEFENSE  
MIL-STD-883  
MIL-STD-973  
-
-
Test Method Standard Microcircuits.  
Configuration Management.  
MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.  
HANDBOOKS  
DEPARTMENT OF DEFENSE  
MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMD's).  
MIL-HDBK-780 - Standard Microcircuit Drawings.  
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094).  
2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein.  
Unless otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DODISS  
cited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DODISS are the issues of the  
documents cited in the solicitation.  
AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM)  
ASTM Standard F1192-95  
-
Standard Guide for the Measurement of Single Event Phenomena from  
Heavy Ion Irradiation of Semiconductor Devices.  
(Applications for copies of ASTM publications should be addressed to the American Society for Testing and Materials,  
1916 Race Street, Philadelphia, PA 19103).  
ELECTRONICS INDUSTRIES ASSOCIATION (EIA)  
JEDEC Standard EIA/JESD78  
-
IC Latch-Up Test.  
(Applications for copies should be addressed to the Electronics Industries Alliance, 2500 Wilson Blvd., Arlington, VA 22201.)  
(Non-Government standards and other publications are normally available from the organizations that prepare or distribute  
the documents. These documents also may be available in or through libraries or other informational services).  
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the  
text of this drawing shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations  
unless a specific exemption has been obtained.  
SIZE  
STANDARD  
5962-90899  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
REVISION LEVEL  
C
SHEET  
COLUMBUS, OHIO 43216-5000  
4
DSCC FORM 2234  
APR 97  

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