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5962-8983913RA PDF预览

5962-8983913RA

更新时间： 2024-02-28 15:51:33
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 时钟输入元件可编程逻辑
页数 文件大小 规格书
13页 262K
描述
EE PLD, 15ns, PAL-Type, CMOS, CDIP20, CERAMIC, DIP-20

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5962-8983913RA 技术参数

生命周期：Transferred零件包装代码：DIP
包装说明：DIP,针数：20
Reach Compliance Code：unknownECCN代码：3A001.A.2.C
HTS代码：8542.39.00.01风险等级：5.23
JESD-30 代码：R-GDIP-T20JESD-609代码：e0
专用输入次数：8I/O 线路数量：8
端子数量：20最高工作温度：125 °C
最低工作温度：-55 °C组织：8 DEDICATED INPUTS, 8 I/O
输出函数：MACROCELL封装主体材料：CERAMIC, GLASS-SEALED
封装代码：DIP封装形状：RECTANGULAR
封装形式：IN-LINE可编程逻辑类型：EE PLD
传播延迟：15 ns认证状态：Not Qualified
筛选级别：MIL-STD-883最大供电电压：5.5 V
最小供电电压：4.5 V标称供电电压：5 V
表面贴装：NO技术：CMOS
温度等级：MILITARY端子面层：TIN LEAD
端子形式：THROUGH-HOLE端子位置：DUAL
Base Number Matches：1

5962-8983913RA 数据手册

 浏览型号5962-8983913RA的Datasheet PDF文件第1页浏览型号5962-8983913RA的Datasheet PDF文件第2页浏览型号5962-8983913RA的Datasheet PDF文件第3页浏览型号5962-8983913RA的Datasheet PDF文件第5页浏览型号5962-8983913RA的Datasheet PDF文件第6页浏览型号5962-8983913RA的Datasheet PDF文件第7页 
PALCE16V8  
Output Current into Outputs (LOW)............................. 24 mA  
DC Programming Voltage............................................. 12.5V  
Latch-Up Current..................................................... >200 mA  
Maximum Ratings  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Storage Temperature .................................–65°C to +150°C  
Operating Range  
Ambient Temperature with  
Ambient  
Power Applied.............................................–55°C to +125°C  
Range  
Commercial  
Military[1]  
Temperature  
VCC  
Supply Voltage to Ground Potential  
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V  
0°C to +75°C  
5V ±5%  
5V ±10%  
5V ±10%  
DC Voltage Applied to Outputs  
in High Z State............................................... –0.5V to +7.0V  
–55°C to +125°C  
–40°C to +85°C  
Industrial  
DC Input Voltage............................................ –0.5V to +7.0V  
Electrical Characteristics Over the Operating Range[2]  
Parameter  
Description  
Test Conditions  
IOH = –3.2 mA  
IOH = –2 mA  
IOL = 24 mA  
Min.  
Max. Unit  
VOH  
Output HIGH Voltage  
VCC = Min.,  
VIN = VIH or VIL  
Com’l  
Mil/Ind  
Com’l  
Mil/Ind  
2.4  
V
VOL  
Output LOW Voltage  
VCC = Min.,  
VIN = VIH or VIL  
0.5  
V
IOL = 12 mA  
VIH  
Input HIGH Level  
Input LOW Level  
Guaranteed Input Logical HIGH Voltage for All Inputs[3]  
Guaranteed Input Logical LOW Voltage for All Inputs[3]  
2.0  
V
V
[4]  
VIL  
–0.5  
0.8  
10  
IIH  
Input or I/O HIGH Leakage 3.5V < VIN < VCC  
Current  
µA  
[5]  
IIL  
Input or I/O LOW Leakage  
Current  
Output Short Circuit Current VCC = Max., VOUT = 0.5V[6, 7]  
0V < VIN < VIN (Max.)  
–100 µA  
–150 mA  
ISC  
ICC  
–30  
Operating Power Supply  
Current  
VCC = Max.,  
VIL = 0V, VIH = 3V,  
Output Open,  
f = 15 MHz  
5, 7 ns  
Com’l  
115  
90  
mA  
mA  
mA  
mA  
mA  
mA  
10, 15, 25 ns  
15L, 25L ns  
10, 15, 25 ns  
15L, 25L ns  
15L, 25L ns  
55  
(counter)  
Mil/Ind  
Mil.  
130  
65  
Ind.  
65  
Capacitance[7]  
Parameter  
CIN  
Description  
Input Capacitance  
Output Capacitance  
Test Conditions  
Typ.  
Unit  
VIN = 2.0V @ f = 1 MHz  
VOUT = 2.0V @ f = 1 MHz  
5
5
pF  
pF  
COUT  
Endurance Characteristics[7]  
Parameter  
Description  
Minimum Reprogramming Cycles  
Test Conditions  
Min.  
100  
Max.  
Unit  
N
Normal Programming Conditions  
Cycles  
Notes:  
1. TA is the “instant on” case temperature.  
2. See the last page of this specification for Group A subgroup testing information.  
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.  
4.  
VIL (Min.) is equal to –3.0V for pulse durations less than 20 ns.  
5. The leakage current is due to the internal pull-up resistor on all pins.  
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems  
caused by tester ground degradation.  
7. Tested initially and after any design or process changes that may affect these parameters.  
Document #: 38-03025 Rev. **  
Page 4 of 13  
1234567...13

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