Datasheet > 5962-03B0105QZC

5962-03B0105QZC

更新时间： 2022-12-01 19:56:08

品牌	Logo	应用领域
ACTEL		栅
页数	文件大小	规格书
217页	1554K
描述
Field Programmable Gate Array, 270000 Gates, CMOS, QFP-160

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MIL-PRF-38535K

INDEX

PARAGRAPH

3.4.2.1

Qualification extension

Qualification inspection

4.4

Qualification procedures

A.4.4

Qualification test failures

H.3.4.7

C.3.7.1

C.3.7.2

H.3.4.6

A.3.4.1.4

3.4.3

Qualification test plan

Qualification test report

Qualification to ESD classes

Qualification to RHA levels

A.3.4.1.3

6.4.34

6.4.21

A.3.1.3.19

6.4.13

A.4.8.1.1.5

A.4.8

Qualified manufacturer's line

Qualified Manufacturer's Listing (QML)

Qualifying activity

Qualifying activity (QA)

Quality assurance operations

Quality assurance program

Quality assurance program plan

Quality assurance requirements

Quality conformance inspection (QCI)

Quality control operations

A.4.8.1.3

A.3.4

A.3.4.4

A.4.5

F.4.7

A.4.8.1.1.4

3.3

Quality management (QM) program

Radiation hardness assurance (RHA)

Radiation response characterization

Radiation source of supply (RSS)

Radiation source of supply (RSS) validations

Re-bonding of monolithic devices

Records to be maintained

6.4.17

A.3.1.3.26

C.4.3

6.4.23

3.4.1.3.2

A.3.7.1.1

A.4.8.1.2

3.13

Recycled, recovered, or environmentally preferable materials

Reference to applicable device specification

Reference to device specification or drawing

Remarking

3.1.1

A.3.1.1

3.7

Remarking

A.3.6.13

A.3

REQUIREMENTS

B.3

REQUIREMENTS

C.3

REQUIREMENTS

D.3

REQUIREMENTS

F.3

REQUIREMENTS

G.3

Requirements for listing on a QML

Resistance to solvents

3.4

F.4.7.2.1

197

1...208 209 210211212 213 214...217

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