5秒后页面跳转
5962-0324601Q9X PDF预览

5962-0324601Q9X

更新时间: 2024-01-23 16:48:58
品牌 Logo 应用领域
ACTEL 时钟外围集成电路
页数 文件大小 规格书
217页 1554K
描述
RISC Microprocessor, 32-Bit, 15MHz, CMOS, DIE

5962-0324601Q9X 技术参数

生命周期:Active包装说明:DIE,
Reach Compliance Code:compliantECCN代码:3A001.A.2.C
HTS代码:8542.31.00.01风险等级:5.71
地址总线宽度:32位大小:32
边界扫描:YES最大时钟频率:30.3 MHz
外部数据总线宽度:32格式:FLOATING POINT
集成缓存:NOJESD-30 代码:X-XUUC-N
低功率模式:YES最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:UNSPECIFIED
封装代码:DIE封装形状:UNSPECIFIED
封装形式:UNCASED CHIP认证状态:Qualified
筛选级别:MIL-PRF-38535 Class Q速度:15 MHz
最大供电电压:3.45 V最小供电电压:3.15 V
标称供电电压:3.3 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:NO LEAD端子位置:UPPER
uPs/uCs/外围集成电路类型:MICROPROCESSOR, RISCBase Number Matches:1

5962-0324601Q9X 数据手册

 浏览型号5962-0324601Q9X的Datasheet PDF文件第5页浏览型号5962-0324601Q9X的Datasheet PDF文件第6页浏览型号5962-0324601Q9X的Datasheet PDF文件第7页浏览型号5962-0324601Q9X的Datasheet PDF文件第9页浏览型号5962-0324601Q9X的Datasheet PDF文件第10页浏览型号5962-0324601Q9X的Datasheet PDF文件第11页 
MIL-PRF-38535K  
CONTENTS  
PARAGRAPH  
PAGE  
A.4.5.4.1 Group C sample selection............................................................................................................................81  
A.4.5.4.1.1 Microcircuit group assignments ................................................................................................................81  
A.4.5.4.1.2 Product acceptable for delivery.................................................................................................................81  
A.4.5.5 Group D inspection.........................................................................................................................................81  
A.4.5.5.1 Group D sample selection............................................................................................................................84  
A.4.5.5.2 Incoming vendor material control program...................................................................................................84  
A.4.5.6 Group E inspection .........................................................................................................................................84  
A.4.5.6.1 Group E sample selection............................................................................................................................84  
A.4.5.7 End-point tests for groups B, C, and D (and E if applicable) inspections........................................................84  
A.4.5.8 Nonconformance ............................................................................................................................................85  
A.4.5.8.1 Group B failure.............................................................................................................................................85  
A.4.5.8.2 Alternate group B failure..............................................................................................................................85  
A.4.5.8.3 Group C failure ............................................................................................................................................86  
A.4.5.8.4 Group D failure ............................................................................................................................................86  
A.4.6 Screening...........................................................................................................................................................86  
A.4.6.1 Burn-in............................................................................................................................................................86  
A.4.6.1.1 Lots and sublots resubmitted for burn-in......................................................................................................86  
A.4.6.1.2 Burn-in acceptance criteria ..........................................................................................................................87  
A.4.6.1.2.1 Failure analysis of burn-in screen failures for class level S devices .........................................................87  
A.4.6.2 External visual screen.....................................................................................................................................87  
A.4.6.3 Particle impact noise detection (PIND) test for class level S devices .............................................................87  
A.4.6.4 Lead forming...................................................................................................................................................87  
A.4.6.5 Nondestructive bond pull test for class level S devices...................................................................................87  
A.4.7 Test results ........................................................................................................................................................88  
A.4.7.1 Screening test data for class level S microcircuits..........................................................................................88  
A.4.8 Quality assurance program................................................................................................................................88  
A.4.8.1 Manufacturer certification................................................................................................................................88  
A.4.8.1.1 Design, processing, manufacturing, and testing instructions.......................................................................89  
A.4.8.1.1.1 Conversion of customer requirements into manufacturer's internal instructions.......................................89  
A.4.8.1.1.2 Personnel training and testing ..................................................................................................................89  
A.4.8.1.1.3 Inspection of incoming materials and utilities, and of work in-process......................................................89  
A.4.8.1.1.4 Quality control operations .........................................................................................................................89  
A.4.8.1.1.5 Quality assurance operations ...................................................................................................................89  
A.4.8.1.1.6 Design, processing, manufacturing equipment, and materials instructions...............................................91  
A.4.8.1.1.7 Cleanliness and atmosphere control in work areas ..................................................................................91  
A.4.8.1.1.8 Design, material, and process change control..........................................................................................91  
A.4.8.1.1.9 Tool, gauge, and test equipment maintenance and calibration.................................................................91  
A.4.8.1.1.10 Failure and defect analysis and feedback...............................................................................................92  
A.4.8.1.1.11 Corrective action and evaluation.............................................................................................................92  
A.4.8.1.1.12 Incoming, in-process, and outgoing inventory control.............................................................................92  
A.4.8.1.1.13 Schematics .............................................................................................................................................92  
A.4.8.1.1.14 ESD handling control program................................................................................................................92  
A.4.8.1.2 Records to be maintained............................................................................................................................92  
A.4.8.1.2.1 Personnel training and testing ..................................................................................................................94  
A.4.8.1.2.1.1 Training of operators and inspectors......................................................................................................94  
A.4.8.1.2.2 Inspection operations................................................................................................................................94  
A.4.8.1.2.3 Failure and defect reports and analyses...................................................................................................94  
A.4.8.1.2.4 Initial documentation and subsequent changes in design, materials, or processing.................................94  
A.4.8.1.2.5 Equipment calibrations..............................................................................................................................95  
A.4.8.1.2.6 Process, utility, and material controls........................................................................................................95  
A.4.8.1.2.7 Product lot identification............................................................................................................................95  
A.4.8.1.2.8 Product traceability ...................................................................................................................................95  
A.4.8.1.3 Quality assurance program plan..................................................................................................................95  
A.4.8.1.3.1 Functional block organization chart ..........................................................................................................96  
A.4.8.1.3.2 Examples of manufacturing flowchart.......................................................................................................96  
viii  

与5962-0324601Q9X相关器件

型号 品牌 描述 获取价格 数据表
5962-0324601QXC ATMEL Low-Voltage Rad-Hard 32-bit SPARC Embedded Processor

获取价格

5962-0324601V9A ATMEL Low-Voltage Rad-Hard 32-bit SPARC Embedded Processor

获取价格

5962-0324601VXC ATMEL Low-Voltage Rad-Hard 32-bit SPARC Embedded Processor

获取价格

5962-0324901QZX ACTEL Video Amplifier, 1 Channel(s), 1 Func, Bipolar, CDSO14, CERAMIC, FP-14

获取价格

5962-0325001QXC ATMEL Field Programmable Gate Array, 2304 CLBs, 46000 Gates, 2304-Cell, CMOS, PQFP160, MQFP-160

获取价格

5962-0325001QXX ACTEL Field Programmable Gate Array, 40000 Gates, CMOS, CQFP160,

获取价格