Datasheet > 5962-01B0101V5B

5962-01B0101V5B

更新时间： 2023-08-15 00:00:00

品牌	Logo	应用领域
ACTEL		栅
页数	文件大小	规格书
217页	1554K
描述
Field Programmable Gate Array, CMOS, CGA-349

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5962-01B0101V5B 数据手册

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MIL-PRF-38535K

INDEX

PARAGRAPH

TABLE C-I. Group E (RHA testing), class Q

Table C-I.

Table D-I.

TABLE D-I. Sample size series (SSS) sampling plan

TABLE D-II. Hypergeometric sampling plans for small lot

sizes of 200 or less

TABLE H-IA. Assembly process qualification testing for

hermetic packages

TABLE H-IB. Assembly process qualification testing for

plastic packages

TABLE H-IIA. Technology style characterization testing for

hermetic packages

Table D-II.

Table H-IA.

Table H-IB.

Table H-IIA.

Table H-IIB.

TABLE H-IIB. Technology style characterization testing for

plastic packages

TABLE IA. Microcircuit screening procedure for hermetic

QML microcircuits

Table IA.

Table IB.

Table II.

Table III.

Table IV.

Table J-I.

Table V.

F.4.2

TABLE IB. Tests/monitors for plastic packages

TABLE II. Group B tests

TABLE III. Group A electrical tests

TABLE IV. Group C tests

TABLE J-I. End-of-line TCI testing procedure (option 1)

TABLE V. Group D tests

Tape

TCI

J.3.9

TCI AND SCREENING INFORMATION

TCI assessment

J.3

3.9.1

TCI reporting

J.3.9.2

H.3.2.2.2.1

H.3.2.2.2

3.9

TCV certification

TCV program

Technology conformance inspection (TCI)

Technology flow

4.3

B.4.2

6.4.20

Technology validation

3.4.1.4

C.3.5.1

F.4.6.3

6.4

Technology validation

Temperature cycle

Terms and definitions

Terms, definitions, and symbols

Test facility change

A.3.1.3

G.3.4.5

A.4.3.4

6.4.35

Test method deviation

Test optimization

J.3.12

Test results

A.4.7

Third party design center

Tightened inspection

6.4.22

D.4.2.6

A.3.5.6.3.5

A.4.8.1.1.9

Tin lead plate

Tool, gauge, and test equipment maintenance and calibration

200

1...211 212 213214215 216 217

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