3D3522Z-10

更新时间： 2024-01-29 18:19:22

品牌	Logo	应用领域
DATADELAY		解码器
页数	文件大小	规格书
4页	259K
描述
MONOLITHIC MANCHESTER DECODER

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数据手册

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3D3522Z-10 数据手册

3D3522

SILICON DELAY LINE AUTOMATED TESTING

TEST CONDITIONS

INPUT:

OUTPUT:

Ambient Temperature: 25^oC ± 3^oC

Supply Voltage (Vcc): 5.0V ± 0.1V

R_load

C_load

10KΩ ± 10%

5pf ± 10%

Input Pulse:

High = 3.0V ± 0.1V

Threshold: 1.5V (Rising & Falling)

Low = 0.0V ± 0.1V

50Ω Max.

Source Impedance:

Rise/Fall Time:

3.0 ns Max. (measured

between 0.6V and 2.4V )

PW_IN= 1/(2*BAUD)

PER_IN= 1/BAUD

Device

Digital

Scope

10KΩ

Under

Test

Pulse Width:

Period:

5pf

470Ω

NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.

PRINTER

COMPUTER

SYSTEM

WAVEFORM

GENERATOR

OUT

IN DEVICE UNDER OUT

TEST (DUT)

DIGITAL SCOPE

TRIG

Figure 2: Test Setup

PER_IN

PW_IN

t_RISE

t_FALL

INPUT

V_IH

2.4V

1.5V

2.4V

1.5V

0.6V

SIGNAL

V_IL

0.6V

t_PLH

t_PHL

OUTPUT

SIGNAL

V_OH

1.5V

V_OL

Figure 3: Timing Diagram

Doc #06005

5/8/2006

DATA DELAY DEVICES, INC.

Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com

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