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2N4053 PDF预览

2N4053

更新时间: 2024-02-25 18:28:29
品牌 Logo 应用领域
其他 - ETC 晶体晶体管
页数 文件大小 规格书
20页 1041K
描述
TRANSISTOR | BJT | PNP | 60V V(BR)CEO | 60A I(C) | TO-36

2N4053 技术参数

生命周期:Obsolete包装说明:,
Reach Compliance Code:unknown风险等级:5.6
最大集电极电流 (IC):60 A配置:Single
最小直流电流增益 (hFE):80最高工作温度:125 °C
极性/信道类型:PNP最大功率耗散 (Abs):170 W
子类别:Other Transistors表面贴装:NO
标称过渡频率 (fT):0.002 MHzBase Number Matches:1

2N4053 数据手册

 浏览型号2N4053的Datasheet PDF文件第6页浏览型号2N4053的Datasheet PDF文件第7页浏览型号2N4053的Datasheet PDF文件第8页浏览型号2N4053的Datasheet PDF文件第10页浏览型号2N4053的Datasheet PDF文件第11页浏览型号2N4053的Datasheet PDF文件第12页 
CY7C1339  
AC Test Loads and Waveforms  
R=317  
3.3V  
[10]  
OUTPUT  
ALL INPUT PULSES  
90%  
OUTPUT  
2.5V  
GND  
90%  
10%  
=50  
Z
0
10%  
2.5 ns  
R =50  
L
5 pF  
R=351  
2.5ns  
V = 1.5V  
L
INCLUDING  
JIG AND  
SCOPE  
(c)  
(a)  
(b)  
[11,12,13]  
Switching Characteristics Over the Operating Range  
-166  
-133  
-100  
Parameter  
Description  
Clock Cycle Time  
Min.  
6.0  
1.7  
1.7  
2.0  
0.5  
Max.  
Min.  
7.5  
1.9  
1.9  
2.5  
0.5  
Max.  
Min.  
Max.  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
10  
3.5  
3.5  
2.5  
0.5  
CYC  
CH  
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Clock HIGH  
Clock LOW  
CL  
Address Set-Up Before CLK Rise  
Address Hold After CLK Rise  
Data Output Valid After CLK Rise  
Data Output Hold After CLK Rise  
ADSP, ADSC Set-Up Before CLK Rise  
ADSP, ADSC Hold After CLK Rise  
BWE, GW, BW[3:0] Set-Up Before CLK Rise  
BWE, GW, BW[3:0] Hold After CLK Rise  
ADV Set-Up Before CLK Rise  
ADV Hold After CLK Rise  
AS  
AH  
3.5  
4.0  
5.5  
CO  
1.5  
2.0  
0.5  
2.0  
0.5  
2.0  
0.5  
2.0  
0.5  
2.0  
0.5  
2.0  
2.5  
0.5  
2.5  
0.5  
2.5  
0.5  
2.5  
0.5  
2.5  
0.5  
2.0  
2.5  
0.5  
2.5  
0.5  
2.5  
0.5  
2.5  
0.5  
2.5  
0.5  
DOH  
ADS  
ADH  
WES  
WEH  
ADVS  
ADVH  
DS  
Data Input Set-Up Before CLK Rise  
Data Input Hold After CLK Rise  
Chip Select Set-Up  
DH  
CES  
CEH  
CHZ  
CLZ  
EOHZ  
EOLZ  
EOV  
Chip Select Hold After CLK Rise  
[12]  
Clock to High-Z  
3.5  
3.5  
3.5  
3.5  
3.5  
4.0  
3.5  
5.5  
5.5  
[12]  
Clock to Low-Z  
0
0
0
0
0
0
[12, 13]  
OE HIGH to Output High-Z  
[12, 13]  
OE LOW to Output Low-Z  
[12]  
OE LOW to Output Valid  
Notes:  
10. Input waveform should have a slew rate of 1 V/ns.  
11. Unless otherwise noted, test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output  
loading of the specified IOL/IOH and load capacitance. Shown in (a) and (b) of AC test loads.  
12. tCHZ, tCLZ, tEOV, tEOLZ, and tEOHZ are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ± 200 mf from steady-state  
voltage.  
13. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ  
.
9
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