MICROCIRCUIT ENHANCED ELEMENT EVALUATION
Mil-PRF-
38534
Subgroup Class
K
Test
Mil-STD-883
Quantity
Reference
Paragraph
Method
Condition
(accept number)
Element Electrical
A. May perform at wafer level
B. All failures shall be removed
from the lot
1
X
100%
C.3.3.1
C. Perform at room ambient
2
3
4
X
X
Element Visual
Internal Visual
2010
2010
100%
10(0) or 22(0)
(See Notes 1 & 2)
C.3.3.2
C.3.3.3
C.3.3.4.2
X
X
Temperature Cycling
Mechanical Shock
or
1010
2002
C
B, Y1
direction
3,000 G, Y1
direction
C.3.3.3
10(0)
22(0)
(See Notes 1 & 2)
Constant Acceleration
2001
X
X
Interim Electrical
Burn-In
C.3.3.4.3
240 hours
minimum at
+125°C
1015
1005
X
X
X
Post Burn-In Electrical
Steady State Life
Final Electrical
C.3.3.4.3
C.3.3.4.3
10(0) wires or
20(1) wires
See method 2018
& Note 2
C.3.3.3
C.3.3.5
5
6
X
X
Wire Bond Evaluation
SEM
2011
2018
C.3.3.6
NOTES:
1. Subgroups 3, 4, & 5 shall be performed on a sample of 10 die if the wafer lot is from a QPL/QML line. If the die are
from commercial wafer lots, then the sample size shall be 22 die. Die from QPL/QML wafers not meeting the QPL/QML
requirements and downgraded to commercial grade shall not be used.
2. Subgroups 3, 4 & 5 shall be performed in the order listed in Table 1. Subgroup 6 may be performed at any time.
CODE IDENT NO.
UNSPECIFIED TOLERANCES
SIZE
DWG NO.
REV.
SHEET
F
A
00136
N/A
DOC200103
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