High Temperature, High Voltage
Performance Characteristics
GENERAL SPECIFICATIONS
Working Voltage:
ENVIRONMENTAL
Vibration:
C0G
X7R
X5U
50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k,
15k, 20k
50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k, 15k,
20k, 30k, 40k, 50k
3k, 4k, 5k, 7.5k, 10k, 15k, 20k
MIL-STD 202, Method 204, Condition D (20g)
Shock:
MIL-STD 202, Method 213, Condition I (100g)
Life Test:
MIL-STD 202, Method 108
<200V
Temperature Characteristics:
C0G
X7R
X5U
0 + 30 PPM / °C from - 55°C to + 125°C (1)
+ 15% from - 55°C to + 125°C
+ 22%, -56% from -55°C to + 85°C
C0G - 200% rated voltage @ +125°C
X7R - 200% rated voltage @ +125°C
>500V
Capacitance Tolerance:
C0G - rated voltage @ +125°C
X7R - rated voltage @ +125°C
X5U - rated voltage @ +85°C
Post Test Limits @ 25°C are:
Capacitance Change:
C0G
X7R
X5U
+0.5pF, +1%, +2%, +5%, +10%
±5%, ±10%, ±20%, +80% / -20%, +100% / -0%
±5%, ±10%, ±20%, +80% / -20%, +100% / -0%
Construction:
Epoxy encapsulated - meets flame test requirements
of UL Standard 94V-0.
High-temperature solder - meets EIA RS-198, Method 302,
Condition B (260°C for 10 seconds)
Termination Material:
C0G (< 200V) - +3% or 0.25pF, whichever is greater.
C0G (> 500V) - +3% or 0.50pF, whichever is greater.
X7R - + 20% of initial value (2)
Dissipation Factor:
C0G - 0.25% maximum
Check individual Series: Part Number and Ordering Information
for Termination Materials offered in each series.
Solderability:
X7R & X5U - 3.0% maximum
Insulation Resistance:
C0G & X7R:
MIL-STD 202, Method 208
(Test Method: ANSI/J-STD-002)
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Test A for through-hole mount and surface mount leaded.
Test B for surface mount leadless components.
Terminal Strength:
MIL-STD 202, Method 208, Condition A (2.3kg or 5 lbs)
Resistance to Solvents:
MIL-STD 202, Method 215
Resistance to Soldering Heat:
MIL-STD 202, Method 210, Test Condition C
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Moisture Resistance:
MIL-STD 202, Method 106
Post Test Limits @ 25°C are:
Capacitance Change:
C0G (< 200V) - +3% or 0.25pF, whichever is greater.
C0G (> 500V) - +3% or 0.50pF, whichever is greater.
X7R - + 20% of initial value (2)
Dissipation Factor:
ELECTRICAL
C0G - 0.25% maximum
Capacitance @ 25°C:
X7R & X5U - 3.0% maximum
Insulation Resistance:
Within specified tolerance and following test conditions per MIL-
STD 202, Method 305.
C0G & X7R:
C0G, X7R & X5U
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
> 100pF with 1.0 vrms @ 1 kHz with 1.0 vrms
< 100pF with 1.0 vrms @ 1 MHz with 1.0 vrms
Dissipation Factor @ 25°C:
X5U:
Same test conditions as capacitance.
C0G - 0.15% maximum
X7R - 2.5% maximum
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Thermal Shock:
X5U - 2.5% maximum
Insulation Resistance @25°C:
MIL-STD 202, Method 302
MIL-STD 202, Method 107, Condition A
C0G & X7R: -55°C to 125°C
X5U: -55°C to 85°C
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
(1)
(2)
+53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM
below 10pF.
X5U:
X7R & X5U dielectrics exhibit aging characteristics;
therefore, it is highly recommended that capacitors be
deaged for 2 hours at 150°C and stabilized at room tem-
perature for 48 hours before capacitance measurements
are made.
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Dielectric Withstanding Voltage:
MIL-STD 202, Method 301
<200V test @ 250% of rated voltage
500V to 1250V test @ 150% of rated voltage
>1251V test @ 120% of rated voltage
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