1N4148UBCA

更新时间： 2024-02-13 23:01:19

品牌	Logo	应用领域
美高森美 - MICROSEMI		/
页数	文件大小	规格书
19页	104K
描述
PERFORMANCE SPECIFICATION

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1N4148UBCA 技术参数

是否Rohs认证：	符合	生命周期：	Active
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8541.10.00.70	风险等级：	5.76
配置：	SINGLE	二极管类型：	RECTIFIER DIODE
最大正向电压 (VF)：	0.715 V	最大非重复峰值正向电流：	2 A
元件数量：	1	最高工作温度：	150 °C
最大输出电流：	0.15 A	最大重复峰值反向电压：	75 V
最大反向恢复时间：	0.004 µs	子类别：	Rectifier Diodes
表面贴装：	YES	Base Number Matches：	1

1N4148UBCA 数据手册

MIL-PRF-19500/116L

1.4 Primary electrical characteristics at T_A= +25 C, unless otherwise indicated.

Type

(1)

V_F1

V_F2

V = 20 V dc

= 75 V dc

A dc

I_FmA dc

V dc

I_FmA dc

V dc

nA dc

1N914

1N4148-1

1N4531

0.8

100

1.2

0.5

Type

(1)

I_R3at

I_R4at

t_frat

t_rr

V_R= 20 V dc

T_A= 150 C

A dc

V_R= 75 V dc

T_A= 150 C

A dc

V_fr= 5.0 V dc (pk) and

I_F= 50 mA dc

1N914

1N4148-1

1N4531

(1) Electrical characteristics for surface mount devices are equivalent to the corresponding non-surface mount

devices unless otherwise noted.

2. APPLICABLE DOCUMENTS

2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This

section does not include documents cited in other sections of this specification or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this

specification, whether or not they are listed.

2.2 Government documents.

2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a

part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are

those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and

supplement thereto, cited in the solicitation (see 6.2).

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-19500

STANDARD

DEPARTMENT OF DEFENSE

MIL-STD-750

Semiconductor Devices, General Specification for.

Test Methods for Semiconductor Devices.

(Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the

Document Automation and Production Services (DAPS), Building 4D (DPM-DODSSP), 700 Robbins Avenue,

Philadelphia, PA 19111-5094.)

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