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02013A0R5CAT2A

更新时间： 2024-01-02 05:54:48
品牌 Logo 应用领域
京瓷/艾维克斯 - KYOCERA AVX /
页数 文件大小 规格书
4页 88K
描述
C0G (NP0) Dielectric General Specifications

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02013A0R5CAT2A 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Active零件包装代码：0201
包装说明：, 0201Reach Compliance Code：compliant
ECCN代码：EAR99HTS代码：8532.24.00.20
Factory Lead Time：12 weeks风险等级：1.67
Samacsys Description：Multilayer Ceramic Capacitors MLCC - SMD/SMT 25V .1pF C0G 0201 .25pF Tol电容：5e-7 µF
电容器类型：CERAMIC CAPACITOR介电材料：CERAMIC
高度：0.33 mmJESD-609代码：e3
长度：0.6 mm安装特点：SURFACE MOUNT
多层：Yes负容差：50%
端子数量：2最高工作温度：125 °C
最低工作温度：-55 °C封装形状：RECTANGULAR PACKAGE
封装形式：SMT包装方法：TR, PAPER, 7 INCH
正容差：50%额定（直流）电压（URdc）：25 V
尺寸代码：0201表面贴装：YES
温度特性代码：C0G温度系数：-/+30ppm/Cel ppm/ °C
端子面层：Tin (Sn) - with Nickel (Ni) barrier端子形状：WRAPAROUND
宽度：0.3 mmBase Number Matches：1

02013A0R5CAT2A 数据手册

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C0G (NP0) Dielectric  
Specifications and Test Methods  
Parameter/Test  
Operating Temperature Range  
Capacitance  
NP0 Specification Limits  
Measuring Conditions  
ꢂemperature Cycle Chamber  
ꢃreq.: 1.0 MHz ± 10ꢁ for cap ꢆ 1000 pꢃ  
1.0 kHz ± 10ꢁ for cap ꢇ 1000 pꢃ  
Voltage: 1.0Vrms ± .2V  
-55ºC to +125ºC  
Within specified tolerance  
ꢄ±0 pꢃ: Qꢅ 400+20 x Cap Value  
ꢅ±0 pꢃ: Qꢅ 1000  
Q
100,000MΩ or 1000MΩ - μꢃ,  
whichever is less  
Charge device with rated voltage for  
60 ± 5 secs ꢈ room tempꢀhumidity  
Charge device with ±00ꢁ of rated voltage for  
1-5 seconds, wꢀcharge and discharge current  
limited to 50 mA (max)  
Insulation Resistance  
Dielectric Strength  
No breakdown or visual defects  
Note: Charge device with 150ꢁ of rated  
voltage for 500V devices.  
Appearance  
Capacitance  
Variation  
No defects  
Deflection: 2mm  
ꢂest ꢂime: ±0 seconds  
±5ꢁ or ±.5 pꢃ, whichever is greater  
Resistance to  
Flexure  
1mm/sec  
Q
Meets Initial Values (As Above)  
ꢅ Initial Value x 0.±  
Stresses  
Insulation  
Resistance  
90 mm  
ꢅ 95ꢁ of each terminal should be covered  
with fresh solder  
No defects, ꢄ25ꢁ leaching of either end terminal  
Dip device in eutectic solder at 2±0 ± 5ºC  
for 5.0 ± 0.5 seconds  
Solderability  
Appearance  
Capacitance  
Variation  
ꢆ ±2.5ꢁ or ±.25 pꢃ, whichever is greater  
Dip device in eutectic solder at 260ºC for 60  
seconds. Store at room temperature for 24 ± 2  
hours before measuring electrical properties.  
Resistance to  
Solder Heat  
Q
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Insulation  
Resistance  
Dielectric  
Meets Initial Values (As Above)  
No visual defects  
Strength  
Appearance  
Capacitance  
Variation  
Step 1: -55ºC ± 2º  
Step 2: Room ꢂemp  
±0 ± ± minutes  
ꢆ ± minutes  
ꢆ ±2.5ꢁ or ±.25 pꢃ, whichever is greater  
Thermal  
Shock  
Q
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Step ±: +125ºC ± 2º  
Step 4: Room ꢂemp  
±0 ± ± minutes  
ꢆ ± minutes  
Insulation  
Resistance  
Dielectric  
Repeat for 5 cycles and measure after  
24 hours at room temperature  
Meets Initial Values (As Above)  
No visual defects  
Strength  
Appearance  
Capacitance  
Variation  
ꢆ ±±.0ꢁ or ± .± pꢃ, whichever is greater  
Charge device with twice rated voltage in  
test chamber set at 125ºC ± 2ºC  
for 1000 hours (+48, -0).  
ꢅ ±0 pꢃ:  
ꢅ10 pꢃ, ꢄ±0 pꢃ:  
ꢄ10 pꢃ:  
Qꢅ ±50  
Qꢅ 275 +5Cꢀ2  
Qꢅ 200 +10C  
Q
Load Life  
(C=Nominal Cap)  
Insulation  
Resistance  
Dielectric  
Remove from test chamber and stabilize at  
room temperature for 24 hours  
before measuring.  
ꢅ Initial Value x 0.± (See Above)  
Meets Initial Values (As Above)  
No visual defects  
Strength  
Appearance  
Capacitance  
Variation  
ꢆ ±5.0ꢁ or ± .5 pꢃ, whichever is greater  
Store in a test chamber set at 85ºC ± 2ºCꢀ  
85ꢁ ± 5ꢁ relative humidity for 1000 hours  
(+48, -0) with rated voltage applied.  
ꢅ ±0 pꢃ:  
ꢅ10 pꢃ, ꢄ±0 pꢃ:  
ꢄ10 pꢃ:  
Qꢅ ±50  
Qꢅ 275 +5Cꢀ2  
Qꢅ 200 +10C  
Load  
Q
Humidity  
Insulation  
Resistance  
Dielectric  
Strength  
Remove from chamber and stabilize at  
room temperature for 24 ± 2 hours  
before measuring.  
ꢅ Initial Value x 0.± (See Above)  
Meets Initial Values (As Above)  
5
1234

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