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Z0107NA0412 PDF预览

Z0107NA0412

更新时间: 2022-09-10 15:47:25
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恩智浦 - NXP 可控硅
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描述
Logic level four-quadrant triac

Z0107NA0412 数据手册

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Z0107NA0  
NXP Semiconductors  
4Q Triac  
4. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDRM  
Parameter  
Conditions  
Min  
Max  
800  
1
Unit  
V
repetitive peak off-state voltage  
RMS on-state current  
-
-
IT(RMS)  
full sine wave; Tlead 45 °C; see Figure 1;  
A
see Figure 3; see Figure 2  
ITSM  
non-repetitive peak on-state  
current  
full sine wave; Tj(init) = 25 °C; tp = 20 ms;  
see Figure 4; see Figure 5  
-
12.5  
A
full sine wave; Tj(init) = 25 °C; tp = 16.7 ms  
tp = 10 ms; sine-wave pulse  
-
-
-
13.8  
0.78  
50  
A
A2s  
I2t  
I2t for fusing  
dIT/dt  
rate of rise of on-state current  
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs;  
T2+ G+  
A/µs  
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs;  
T2+ G-  
-
-
-
50  
50  
20  
A/µs  
A/µs  
A/µs  
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs;  
T2- G-  
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs;  
T2- G+  
IGM  
peak gate current  
peak gate power  
-
1
A
PGM  
PG(AV)  
Tstg  
Tj  
-
2
W
W
°C  
°C  
average gate power  
storage temperature  
junction temperature  
over any 20 ms period  
-
0.1  
150  
125  
-40  
-
003aac264  
003aaf977  
1.2  
16  
I
T(RMS)  
(A)  
I
T(RMS )  
(A)  
12  
0.8  
0.4  
0
8
4
0
-2  
-1  
-50  
0
50  
100  
150  
( C)  
10  
10  
1
10  
T
surge duration (s)  
°
lead  
Fig 1. RMS on-state current as a function of lead  
temperature; maximum values  
Fig 2. RMS on-state current as a function of surge  
duration; maximum values  
Z0107NA0  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2011. All rights reserved.  
Product data sheet  
Rev. 3 — 12 May 2011  
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