Z0103MN
NXP Semiconductors
Logic level four-quadrant triac
4. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
VDRM
repetitive peak off-state
voltage
-
600
V
IT(RMS)
dIT/dt
RMS on-state current
half sine wave; Tsp ≤ 89 °C; see Figure 1 and 4
-
1
A
rate of rise of on-state IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs; T2+ G-
current
-
50
50
20
50
1
A/µs
A/µs
A/µs
A/µs
A
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs; T2+ G+
-
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs; T2- G+
IT = 1 A; IG = 20 mA; dIG/dt = 100 mA/µs; T2- G-
peak gate current
-
-
IGM
PGM
Tstg
Tj
-
peak gate power
-
2
W
storage temperature
-40
150
125
8.5
8
°C
junction temperature
-
-
-
°C
ITSM
non-repetitive peak
on-state current
full sine wave; tp = 16.7 ms; Tj(init) = 25 °C
A
full sine wave; tp = 20 ms; Tj(init) = 25 °C;
see Figure 2 and 3
A
I2t
I2t for fusing
tp = 10 ms; sine-wave pulse
-
-
0.32
0.1
A2s
W
PG(AV)
average gate power
003aac259
2.0
conduction form
Ptot
(W)
angle
(degrees)
factor
a
1.6
1.2
0.8
0.4
0.0
30
60
90
120
180
4
α= 180°
2.8
2.2
1.9
1.57
α
120°
90°
60°
30°
0
0.2
0.4
0.6
0.8
1
1.2
IT(RMS) (A)
Fig 1. Total power dissipation as a function of RMS on-state current; maximum values
Z0103MN_3
© NXP B.V. 2009. All rights reserved.
Product data sheet
Rev. 03 — 5 August 2009
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