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SN74ALS155 PDF预览

SN74ALS155

更新时间: 2024-11-18 23:06:15
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德州仪器 - TI 解复用器
页数 文件大小 规格书
4页 45K
描述
DUAL 2-LINE TO 4-LINE DECODER/DEMULTIPLEXER

SN74ALS155 数据手册

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SN74ALS155  
DUAL 2-LINE TO 4-LINE DECODER/DEMULTIPLEXER  
SDAS140 — NOVEMBER 1987  
D or N Package  
(Top View)  
Applications:  
Dual 2-Line to 4-Line Decoder  
Dual 1-Line to 4-Line Demultiplexer  
3-Line to 8-Line Decoder  
1-Line to 8-Line Demultiplexer  
V
1C  
1G  
B
1Y3  
1Y2  
1Y1  
1Y0  
GND  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
CC  
2C  
2G  
A
Individual Strobes Simplify Cascading For  
Decoding or Demultiplexing Larger Words  
2Y3  
2Y2  
2Y1  
2Y0  
Package Options Include Plastic “Small  
Outline” Packages and Standard Plastic  
300-mil DIPs  
description  
The ALS155 circuits feature dual 1-line to 4-line  
logic diagram (positive logic)  
demultiplexers with individual strobes and  
common binary-address inputs in a single 16-pin  
package. When both sections are enabled, the  
common binary-address inputs sequentially  
select and route associated input data to the  
appropriate output of each section. The individual  
strobes permit enabling or disabling each of the  
4-bit sections as desired.  
7
2
1
STROBE  
1G  
OUTPUT  
1Y0  
DATA  
1C  
6
OUTPUT  
1Y1  
5
OUTPUT  
1Y2  
3
SELECT  
B
Data applied to input 1C is inverted at its outputs  
and data applied at input 2C is not inverted  
through its outputs. The inverter following the 1C  
data input permits use of the ALS155 as a 3-line  
to 8-line demultiplexer without external gating. All  
inputs are clamped with high-performance  
Schottky diodes to suppress line ringing and  
simplify system design.  
4
OUTPUT  
1Y3  
9
OUTPUT  
2Y0  
13  
SELECT  
A
10  
11  
12  
OUTPUT  
2Y1  
The SN74ALS155 is characterized for operation  
from 0°C to 70°C.  
15  
14  
DATA  
2C  
OUTPUT  
2Y2  
STROBE  
1G  
OUTPUT  
2Y3  
PRODUCTION DATA information is current as of  
publicationdate. Products conformtospecifications  
per the terms of Texas Instruments standard  
warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright 1987, Texas Instruments Incorporated  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
1

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