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SMV512K32HFG PDF预览

SMV512K32HFG

更新时间: 2022-03-21 19:53:04
品牌 Logo 应用领域
德州仪器 - TI 静态存储器
页数 文件大小 规格书
25页 361K
描述
16-Mb RADIATION-HARDENED SRAM

SMV512K32HFG 数据手册

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SMV512K32-SP  
SLVSA21H JUNE 2011REVISED JULY 2013  
www.ti.com  
OPERATIONS  
SMV512K32 has four control inputs called chip enable-1 (E1Z), chip enable-2 (E2), write enable (WZ) and output  
enable (GZ); 19 address inputs A[18:0] and a 32-bit bidirectional data bus DQ[31:0]. E1Z and E2 enable control  
device selection, active and stand-by modes (with and without scrub). WZ controls read and write operations.  
During read operation, GZ must be asserted to enable the outputs.  
Table 2. SRAM Device Control Operation Truth Table  
E1Z  
E2  
GZ  
WZ  
MBE  
I/O MODE  
MODE  
Standby without EDAC scrub  
enable  
H
X
X
X
X
DQ[31:0] 3-State  
Standby with EDAC scrub  
enable(1)  
L
L
X
X
X
DQ[31:0] 3-state  
L
L
L
H
H
H
L
X
H
H
L
X
X
L
DQ[31:0] Data out  
DQ[31:0] Data in  
DQ[31:0] 3-state  
Word read  
Word write  
3-state  
H
EDAC function select  
(see Table 7)(2)  
L
H
H
H
H
DQ[31:0] Data in/out  
(1) During SCRUB mode, MBE is 3-state if GZ is high and indicates multiple or single bit error if GZ is low.  
(2) Special precautions must be observed to prevent accidental over-writing of the Control Register in the memory after a bit error is  
detected and the memory drives MBE high (please refer to the next section).  
Procedures for Controlling the MBE Pin  
A 1-kresistor must be attached from the MBE pin to ground to insure that MBE cannot float high during time  
intervals when it is not actively driven HIGH by the memory or actively driven by the external memory control.  
During normal EDAC operation, the control registers are set as shown by Sequence 1 in Table 3. Whenever the  
EDAC circuit encounters either a multiple-bit error or single-bit error (depending on user configuration), the MBE  
pin is driven high by the memory as shown by Sequence 2 in Table 3 . Following this the MBE will need to be  
reset (low) to restore the detection circuit for the next bit error event. The MBE pin will be pulled low by the 1-kΩ  
resistor when GZ is switched to high state. However, to accomplish the MBE reset properly and avoid an  
accidental write to the control register, the memory must first be disabled by switching either E1Z to high or E2 to  
low (Sequence 3) before switching GZ from low to high (Sequence 4). Note however, that if E1Z is switched to  
high this will disable scrub during the interval that GZ is being set high after the memory is disabled.  
The memory must remain disabled long enough to insure that MBE is pulled low before the memory is enabled  
again. During the time the memory is disabled the address at which the MBU was detected must also be  
changed to access the last known error free address. After the address is changed the memory can be enabled  
with GZ high. Then an Output Enable-controlled read operation can be performed using the last known error free  
address. This turns off the MBE error flag in the memory and causes the memory to drive MBE low after the GZ-  
controlled output data valid time, tGLMV  
.
This procedure resets the memory back into its normal EDAC read state in which the memory will drive MBE low  
sequentially for each read operation until the next bit error is encountered. This avoids accidental over-writing of  
the Control Register in the memory. After this procedure is completed the system protocol for responding to bit  
errors can be executed.  
6
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Copyright © 2011–2013, Texas Instruments Incorporated  
Product Folder Links: SMV512K32-SP  

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