SM73307
www.ti.com
SNOSB88B –JUNE 2011–REVISED APRIL 2013
Dual Precision, 17 MHz, Low Noise, CMOS Input Amplifier
Check for Samples: SM73307
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FEATURES
DESCRIPTION
The SM73307 is a dual, low noise, low offset, CMOS
input, rail-to-rail output precision amplifier with a high
gain bandwidth product. The SM73307 is ideal for a
variety of instrumentation applications including solar
photovoltaic.
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Unless Otherwise Noted, Typical Values at VS
= 5V.
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Renewable Energy Grade
Input Offset Voltage ±150 μV (max)
Input Bias Current 100 fA
Utilizing a CMOS input stage, the SM73307 achieves
an input bias current of 100 fA, an input referred
voltage noise of 5.8 nV/√Hz, and an input offset
voltage of less than ±150 μV. These features make
Input Voltage Noise 5.8 nV/√Hz
Gain Bandwidth Product 17 MHz
Supply Current 1.30 mA
the SM73307
applications.
a
superior choice for precision
Supply Voltage Range 1.8V to 5.5V
THD+N @ f = 1 kHz 0.001%
Consuming only 1.30 mA of supply current per
channel, the SM73307 offers a high gain bandwidth
product of 17 MHz, enabling accurate amplification at
high closed loop gains.
Operating Temperature Range −40°C to 125°C
Rail-to-rail Output Swing
8-Pin VSSOP Package
The SM73307 has a supply voltage range of 1.8V to
5.5V, which makes it an ideal choice for portable low
power applications with low supply voltage
requirements.
APPLICATIONS
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Photovoltaic Electronics
Active Filters and Buffers
Sensor Interface Applications
Transimpedance Amplifiers
Automotive
The SM73307 is built with TI’s advanced VIP50
process technology and is offered in an 8-pin VSSOP
package.
The SM73307 incorporates enhanced manufacturing
and support processes for the photovoltaic and
automotive market, including defect detection
methodologies. Reliability qualification is compliant
with the requirements and temperature grades
defined in the Renewable Energy Grade and AEC-
Q100 standards.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011–2013, Texas Instruments Incorporated