S29WS512P
S29WS256P
S29WS128P
SUPPLEMENT
13. Revision History
Document Title:S29WS512P, S29WS256P, S29WS128P
512/256/128 Mb (32/16/8 M x 16 bit), 1.8 V, Simultaneous Read/Write Flash
Document Number: 002-01747
Orig. of
Change
Submission
Date
Rev.
ECN No.
Description of Change
Spansion Publication Number: S30MS02GR_SP1_QDB
A6:Features: Removed Zero Hold mode
Switching Waveforms: Revised VCC Power-up diagram
11/03/2006
11/08/2006
03/09/2007
Timing Diagrams: Changed tCR to tRDY in figure 11.7 and figure 11.8
A7:Features: Updated Effective Write Buffer Programming Per Word
Erase/Program Timing: tESL changed to Max
tPSL changed to Max
CMOS Compatible: Removed Note 2 from table.
A8:Asynchronous Mode Read: Changed tCR to tRDY in figures 11.9 through 11.12
Common Flash Memory Interface: Revised Device Geometry table:
Changed WS512P data to 00FDh
Address 32h - Data changed to 001h
Address 33h - Data changed to 000h
Address 34h - Data changed to 002h
Revised CFI table: removed Uniform Bottom, Uniform Top, and All sectors for Address
4Fh
DC Characteristics: Revised ICCB Burst table
A9:DC Characteristics: Revised ICCB for 108 MHz frequencies to TBA
Synchronous/Burst Read: Revised tRACC to 7.6 ns
Asynchronous Mode Read: Revised tAAVDH to 4 ns
03/27/2007
04/20/2007
A10:AC Characteristics:
Removed wait state below 14 MHz, wait state 2
Added additional wait state to all wait state frequency in table 11.4
Added Continuous Burst Mode Synchronous Wait State Requirement table
Revised Burst Access Time to (WS-1) * tCK + (tBACC)
**
-
WIOB
A11:Data Sheet Status: Changed to Production
09/28/2007
Global: Changed all 108 MHz to 104 MHz
Latency: Added 10 wait state and 11 wait state latency tables
Configuration Registers: Added two more configurations to CR0.11 for 10th and 11th
rising CLK edge
AC Characteristics: Revised tCES to 6 ns
Revised tAVD to tCLK
DC Characteristics: Changed description of ICC2 to VCC Active Program/Erase Cur-
rent
Change descritpion of ICC5 to VCC Active Current (Read while Program/Erase)
Erase/Program Timing and Performance:
Revised:
tERS to 40 µs
tESL to 40 µs
tPSL to 40 µs
tPRS to 40 µs
Output Slew Rate:
Deleted Programmable Outuput Slew Rate Control section
A12:Configuration Registers: Changed CR0.14 default setting to 1
AC Characteristics: Added device Vcc ramp rate limit. Updated timing diagrams for
Synchronous/Burst Read, Asynchronous Program Operation, Synchronous Program
Operation, and Chip Sector Erase Command Sequence.
01/28/2008
Program/Erase Operations: Added details to Program and Erase Suspend/Resume
operations
*A
*B
5046533
5790689
WIOB
NIBK
12/14/2015
06/29/2017
Updated to Cypress Template
Updated to Cypress Logo and Copyright.
Document Number: 002-01747 Rev. *B
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