Datasheet > RT15N0R5B250

RT15N0R5B250

更新时间： 2024-04-09 18:56:37

品牌	Logo	应用领域
华新科技 - WALSIN		/
页数	文件大小	规格书
10页	3083K
描述
0402, NPO, 0.5pF, 25Vdc

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RT15N0R5B250 数据手册

Multilayer Ceramic Capacitors

AEC-Q200

Approval Sheet

No.

AEC-Q200 Test Condition

Requirements

Test Item

17. Electrical

Characterization

* Capacitance

* Capacitance within the specified tolerance.

* Q. value

* Q. value: NPO: Cap≥30pF, Q≥1000 ; Cap<30pF, Q≥400+20C.

Cap≤1000pF 1.0±0.2Vrms, 1MHz±10%

Cap>1000pF 1.0±0.2Vrms, 1KHz±10%

* Test temp.: Room Temperature.

* Insulation Resistance

* IR. ≥10GΩ or RxC≥500Ω-F whichever is smaller.

To apply rated voltage(500V max.) for max. 120 sec

* Test temp.: Room Temperature..

* Dielectric Strength

* Dielectric strength

To apply voltage:

No evidence of damage or flash over during test.

≦100

≥2.5 times VDC

, duration 1~5 sec,

charge and discharge current less than 50mA.

* Temperature Coefficient (with no electrical load)

Operation temperature: -55~125°C at 25°C

* Temperature Coefficient

Capacitance Change: NPO: Within ±30ppm/°C

18.

Board Flex

* The middle part of substrate shall be pressurized by * No remarkable damage.

AEC-Q200-005

means of the pressurizing rod at a rate of about 1

* Cap change： NPO: within ±5% or 0.5pF whichever is larger

mm per second until the deflection becomes 5 mm (This capacitance change means the change of capacitance under specified

and then the pressure shall be maintained for 60±1 flexure of substrate from the capacitance measured before the test.)

sec.

* Measurement to be made after keeping at room

temp. for 24±2 hrs.

19.

Terminal Strength * Pressurizing force：

AEC-Q200-006 2N (0201 & 0402), 10N(0603), 18N(≥0805).

* No remarkable damage or removal of the terminations.

* Capacitance within the specified tolerance.

* Test time: 60±1 sec.

* Q. value: NPO: Cap≥30pF, Q≥1000 ; Cap<30pF, Q≥400+20C.

20 Beam Load Test

* Break strength test

The chip endure following force

AEC-Q200-003

* Beam speed: 2.5±0.25 mm/sec

* Chip length ≤2.5mm: Thickness >0.5mm (20N), ≤0.5mm (8N)

* Chip length ≥3.2mm: Thickness ≥1.25mm (54.5N), <1.25mm (15N)

21 ESR

The ESR should be measured at room temperature

and tested at frequency 1±0.1 GHz.

0402

0.1pF≤Cap≤1pF:< 350mΩ/pF

1pF<Cap≤5pF:< 300mΩ

5pF<Cap≤100pF:< 250mΩ

* "Room condition" Temperature: 15 to 35°C, Relativ e humidity: 25 to 75%, Atmospheric pressure: 86 to 106kPa.

Page 7 of 10

ASC_Microwave_AECQ200_RT

Feb. 2023

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