Datasheet > RS810

RS810

更新时间： 2024-04-09 18:59:24

品牌	Logo	应用领域
润石 - RUNIC		/
页数	文件大小	规格书
14页	459K
描述
电压检测和复位

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RS810 数据手册

RS810

8 Specifications

8.1 Absolute Maximum Ratings ⁽¹⁾

over operating free-air temperature range (unless otherwise noted) ⁽¹⁾⁽²⁾

MIN

-0.5

MAX

6.0

UNIT

V_CC

V_I

Supply voltage range

Input voltage range ⁽²⁾

6.0

Voltage range applied to any output in the high-impedance or power-off

state⁽²⁾

Voltage range applied to any output in the high or low state ⁽²⁾⁽³⁾

-0.5

6.0

I_IK

°C/W

°C

V_CC+0.5

-20

Input clamp current

V_I<0

I_OK

I_O

Output clamp current

V_O<0

-20

Continuous output current

Continuous current through V_CCor GND

Package thermal impedance ⁽⁴⁾

Junction temperature ⁽⁵⁾

Storage temperature

±20

θ_JA

T_J

SOT23

295

150

125

-65

-40

T_stg

T_A

°C

Operating temperature

°C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2) The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.

(3) The value of V_CCis provided in the Recommended Operating Conditions table.

(4) The package thermal impedance is calculated in accordance with JESD-51.

(5) The maximum power dissipation is a function of T_J(MAX), R_θJA, and T_A. The maximum allowable power dissipation at any ambient

temperature is P_D= (T _J(MAX)- T_A) / R_θJA. All numbers apply for packages soldered directly onto a PCB.

8.2 ESD Ratings

The following ESD information is provided for handling of ESD-sensitive devices in an ESD protected area only.

VALUE

UNIT

Human-body model (HBM), MIL-STD-883K METHOD 3015.9

Machine model (MM), JESD22-A115C (2010)

±4000

±200

V_(ESD)Electrostatic discharge

ESD SENSITIVITY CAUTION

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

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