Datasheet > MC33742PEP

MC33742PEP

更新时间： 2024-02-25 05:26:06

品牌	Logo	应用领域
恩智浦 - NXP		电信电信集成电路
页数	文件大小	规格书
72页	1211K
描述
System Basis Chip, CAN, 2x 5.0V/200mA LDOs, 4 wake ups, 15 ms reset duration, QFN 48, Tray

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技术参数
数据手册

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MC33742PEP 技术参数

是否无铅：	不含铅	是否Rohs认证：	符合
生命周期：	Transferred	Reach Compliance Code：	compliant
ECCN代码：	EAR99	HTS代码：	8542.39.00.01
风险等级：	5.6	JESD-609代码：	e3
湿度敏感等级：	3	峰值回流温度（摄氏度）：	260
电信集成电路类型：	TELECOM CIRCUIT	端子面层：	Matte Tin (Sn)
处于峰值回流温度下的最长时间：	40	Base Number Matches：	1

MC33742PEP 数据手册

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 4. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Rating

Symbol

Value

Unit

ELECTRICAL RATINGS

Power Supply Voltage at VSUP

Continuous (Steady-state)

V_SUP

-0.3 to 27

-0.3 to 40

Transient Voltage (Load Dump)

Logic Signals 

V_LOG

-0.3 to V_DD+ 0.3

(RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and INT)

Output Voltage at VDD

Output Current at VDD

V_DD

I_DD

0.0 to 5.3

Internally Limited

Voltage

V_HS

I_HS

-0.3 to V_SUP+ 0.3

Internally Limited

Output Current

ESD Capability, Human Body Model⁽¹⁾

MC33742 in 28-pin SOIC

HS, L0, L1, L2, L3, CANH, CANL pins

All Other pins

V_ESD1

±4000

±2000

MC33742 in 48-pin QFN

All pins

±2000

±200

ESD Capability, Machine Model⁽¹⁾

V_ESD2

Input Voltage/Current at L0, L1, L2, L3

DC Input Voltage

V_DCIN

I_DCIN

-0.3 to 40

±2.0

DC Input Current

Transient Input Voltage attached to external circuitry⁽²⁾

V_TRINEC

±100

CANL and CANH

Continuous Voltage

Continuous Current

V_CANH/L

I_CANH/L

-27 to 40

200

CANH and CANL Transient Voltage (Load Dump)⁽³⁾

CANH and CANL Transient Voltage⁽³⁾

Notes

V_LDH/L

V_TRH/L

±40

1. Testing done in accordance with the Human Body Model (C_ZAP=100 pF, R_ZAP=1500 ), Machine Model (C_ZAP=200 pF, R_ZAP=0 ).

2. Testing done in accordance with ISO 7637-1. See Figure 5.

3. Load dump testing done in accordance with ISO 7637-1, Transient test done in accordance with ISO 7637-1. See Figure 6.

33742

Analog Integrated Circuit Device Data

Freescale Semiconductor

1...4 5 678 9 10...72

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