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MC14569B_05 PDF预览

MC14569B_05

更新时间: 2024-02-03 09:30:02
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安森美 - ONSEMI 计数器
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14页 146K
描述
Programmable Divide-By-N Dual 4-Bit Binary/BCD Down Counter

MC14569B_05 数据手册

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MC14569B  
Programmable Divide−By−N  
Dual 4−Bit Binary/BCD  
Down Counter  
The MC14569B is a programmable divide−by−N dual 4−bit binary  
or BCD down counter constructed with MOS P−Channel and  
N−Channel enhancement mode devices (complementary MOS) in a  
monolithic structure.  
This device has been designed for use with the MC14568B phase  
comparator/counter in frequency synthesizers, phase−locked loops,  
and other frequency division applications requiring low power  
dissipation and/or high noise immunity.  
http://onsemi.com  
MARKING  
DIAGRAMS  
16  
1
PDIP−16  
P SUFFIX  
CASE 648  
MC14569BCP  
AWLYYWW  
Features  
Speed−up Circuitry for Zero Detection  
Each 4−Bit Counter Can Divide Independently in BCD or Binary Mode  
Can be Cascaded With MC14526B for Frequency Synthesizer  
Applications  
16  
14  
569B  
ALYW  
TSSOP−16  
DT SUFFIX  
CASE 948F  
All Outputs are Buffered  
Schmitt Triggered Clock Conditioning  
1
Pb−Free Packages are Available*  
16  
MAXIMUM RATINGS (Voltages Referenced to V  
)
SS  
SOIC−16  
DW SUFFIX  
CASE 751G  
14569B  
AWLYYWW  
Symbol  
Parameter  
Value  
0.5 to +18.0  
Unit  
V
V
DD  
DC Supply Voltage Range  
V , V  
in out  
Input or Output Voltage Range  
(DC or Transient)  
0.5 to V + 0.5  
V
DD  
1
I , I  
in out  
Input or Output Current  
(DC or Transient) per Pin  
±10  
mA  
A
WL, L  
YY, Y  
= Assembly Location  
= Wafer Lot  
= Year  
P
D
Power Dissipation, per Package  
(Note 1)  
500  
mW  
WW, W = Work Week  
T
Ambient Temperature Range  
Storage Temperature Range  
55 to +125  
65 to +150  
260  
°C  
°C  
°C  
A
T
stg  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 2 of this data sheet.  
T
Lead Temperature  
(8−Second Soldering)  
L
Maximum ratings are those values beyond which device damage can occur.  
Maximum ratings applied to the device are individual stress limit values (not  
normal operating conditions) and are not valid simultaneously. If these limits are  
exceeded, device functional operation is not implied, damage may occur and  
reliability may be affected.  
1. Temperature Derating:  
Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C  
This device contains protection circuitry to guard against damage due to high  
static voltages or electric fields. However, precautions must be taken to avoid  
applications of any voltage higher than maximum rated voltages to this  
high−impedance circuit. For proper operation, V and V should be constrained  
in  
out  
to the range V v (V or V ) v V  
.
SS  
in  
out  
DD  
Unused inputs must always be tied to an appropriate logic voltage level  
(e.g., either V or V ). Unused outputs must be left open.  
SS  
DD  
*For additional information on our Pb−Free strategy and soldering details, please  
download the ON Semiconductor Soldering and Mounting Techniques  
Reference Manual, SOLDERRM/D.  
Semiconductor Components Industries, LLC, 2005  
1
Publication Order Number:  
February, 2005 − Rev. 5  
MC14569B/D  
 

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