November 1995
LMF380 Triple One-Third Octave
Switched-Capacitor Active Filter
General Description
The LMF380 is a triple, one-third octave filter set designed
for use in audio, audiological, and acoustical test and mea-
surement applications. Built using advanced switched-ca-
pacitor techniques, the LMF380 contains three filters, each
having a bandwidth equal to one-third of an octave in fre-
quency. By combining several LMF380s, each covering a
frequency range of one octave, a filter set can be imple-
mented that encompasses the entire audio frequency range
while using only a small fraction of the number of compo-
nents and circuit board area that would be required if a con-
ventional active filter approach were used. The center fre-
quency range is not limited to the audio band, however.
Center frequencies as low as 0.125 Hz or as high as 25 kHz
are attainable with the LMF380.
Accuracy is enhanced by close matching of the internal
components: the ratio of the clock frequency to the center
g
frequency is typically accurate to 0.5%, and passband
gain and stopband attenuation are guaranteed over the full
temperature range.
Features
Y
Three bandpass filters with one-third octave center fre-
quency spacing
Y
Choice of internal or external clock
Y
No external components other than clock or crystal and
two capacitors
Key Specifications
Y
The center frequency of each filter is determined by the
clock frequency. The clock signal can be supplied by an
external source, or it can be generated by the internal oscil-
lator, using an external crystal and two capacitors. Since the
Passband gain accuracy: Better than 0.7 dB over
temperature
Y
a
a
Supply voltage range: 2V to 7.5V or 4V to 14V
g
g
d
LMF380 has an internal clock frequency divider ( 2) and
Applications
Y
an output pin for the half-frequency clock signal, a single
clock oscillator for the top-octave LMF380 becomes the
master clock for the entire array of filters in a multiple
LMF380 application.
Real-Time Audio Analyzers (ANSI Type E, Class II)
Y
Acoustical Instrumentation
Y
Noise Testing
Simplified Block Diagram
TL/H/11123–1
C
1995 National Semiconductor Corporation
TL/H/11123
RRD-B30M115/Printed in U. S. A.